Inventor · disambiguated record
Kenneth W. Nill
Also filed as: NILL KENNETH W
8 granted patents·1 pending application·409 citations·filing 1977–2007
90Inventor score
Top patents by PatentIndex Score
9 records- 0197US7920676B2CD-GISAXS system and methodXRADIA INC·Filed 2007·Granted Apr 5, 2011·86 cites·71 claims
- 0295US7245696B2Element-specific X-ray fluorescence microscope and method of operationXRADIA INC·Filed 2002·Granted Jul 17, 2007·100 cites·61 claims
- 0395US7183547B2Element-specific X-ray fluorescence microscope and method of operationXRADIA INC·Filed 2004·Granted Feb 27, 2007·84 cites·17 claims
- 0491US6885503B2Achromatic fresnel optics based lithography for short wavelength electromagnetic radiationsXRADIA INC·Filed 2002·Granted Apr 26, 2005·46 cites·39 claims
- 0585US4410273AScanning laser spectrometerLASER ANALYTICS INC·Filed 1981·Granted Oct 18, 1983·65 cites·2 claims
- 0683US6804281B1Large modal volume semiconductor laser system with spatial mode filterFiled 2002·Granted Oct 12, 2004·18 cites·26 claims
- 0750US7106773B1Large modal volume semiconductor laser system with spatial mode filterWALPOLE JAMES N·Filed 2004·Granted Sep 12, 2006·3 cites·19 claims
- 0849US4196402AHigher power semiconductor radiating mirror laserLASER ANALYTICS INC·Filed 1977·Granted Apr 1, 1980·7 cites·20 claims
- 0944US2005282300A1Back-end-of-line metallization inspection and metrology microscopy system and method using x-ray fluorescenceXRADIA INC·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →