Inventor · disambiguated record
Kentaro Ohira
Also filed as: OHIRA KENTARO
2 granted patents·2 pending applications·2 citations·filing 2017–2022
34Inventor score
Files withHITACHI HIGH TECH CORP4
Top patents by PatentIndex Score
4 records- 0182US11193895B2Semiconductor substrate for evaluation and method using same to evaluate defect detection sensitivity of inspection deviceHITACHI HIGH TECH CORP·Filed 2017·Granted Dec 7, 2021·2 cites·15 claims
- 0248US12423941B2Image recognition systemHITACHI HIGH TECH CORP·Filed 2022·Granted Sep 23, 2025·0 cites·11 claims
- 0345US2025054270A1Labeled training data creation assistance device and labeled training data creation assistance methodHITACHI HIGH TECH CORP·Filed 2021·Application pending·0 cites
- 0437US2022107280A1Defect Inspection Device and Defect Inspection MethodHITACHI HIGH TECH CORP·Filed 2019·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →