Inventor · disambiguated record
Kenji Oka
Also filed as: OKA KENJI
70 granted patents·10 pending applications·1,181 citations·filing 1980–2017
99Inventor score
Top patents by PatentIndex Score
80 records- 0197US5774222AManufacturing method of semiconductor substrative and method and apparatus for inspecting defects of patterns on an object to be inspectedHITACHI LTD·Filed 1995·Granted Jun 30, 1998·167 cites·38 claims
- 0294US7274813B2Defect inspection method and apparatusHITACHI LTD·Filed 2005·Granted Sep 25, 2007·18 cites·24 claims
- 0394US7061602B2Method of inspecting a semiconductor device and an apparatus thereofHITACHI HIGH TECH CORP·Filed 2005·Granted Jun 13, 2006·18 cites·13 claims
- 0494US6690469B1Method and apparatus for observing and inspecting defectsHITACHI LTD·Filed 1999·Granted Feb 10, 2004·98 cites·35 claims
- 0593US8107717B2Defect inspection method and apparatusMAEDA SHUNJI·Filed 2011·Granted Jan 31, 2012·14 cites·16 claims
- 0693US6404498B1Manufacturing method of semiconductor substrate and method and apparatus for inspecting defects of patterns on an object to be inspectedHITACHI LTD·Filed 2000·Granted Jun 11, 2002·38 cites·26 claims
- 0791US7773210B2Appearance inspection apparatusHITACHI HIGH TECH CORP·Filed 2009·Granted Aug 10, 2010·10 cites·11 claims
- 0891US7417723B2Method of inspecting a semiconductor device and an apparatus thereofHITACHI LTD·Filed 2006·Granted Aug 26, 2008·10 cites·12 claims
- 0991US6947587B1Defect inspection method and apparatusHITACHI LTD·Filed 1999·Granted Sep 20, 2005·88 cites·30 claims
- 1091US6456951B1Method and apparatus for processing inspection dataHITACHI LTD·Filed 2000·Granted Sep 24, 2002·58 cites·27 claims
- 1190US8883529B2Method for manufacturing semiconductor light emitting deviceNICHIA CORP·Filed 2013·Granted Nov 11, 2014·5 cites·16 claims
- 1290US7557911B2Appearance inspection apparatusHITACHI HIGH TECH CORP·Filed 2007·Granted Jul 7, 2009·10 cites·5 claims
- 1390US6888959B2Method of inspecting a semiconductor device and an apparatus thereofHITACHI HIGH TECH ELECT ENG CO·Filed 2001·Granted May 3, 2005·38 cites·20 claims
- 1490US6674890B2Defect inspection method and apparatus thereforHITACHI LTD·Filed 2000·Granted Jan 6, 2004·41 cites·10 claims
- 1590US6169282B1Defect inspection method and apparatus thereforHITACHI LTD·Filed 1998·Granted Jan 2, 2001·107 cites·32 claims
- 1690US6091075AAutomatic focus detection method, automatic focus detection apparatus, and inspection apparatusHITACHI LTD·Filed 1998·Granted Jul 18, 2000·99 cites·42 claims
- 1789US6263099B1Manufacturing method of semiconductor substrate and method and apparatus for inspecting defects of patterns of an object to be inspectedHITACHI LTD·Filed 1998·Granted Jul 17, 2001·56 cites·28 claims
- 1888US7376247B2Target detection system using radar and image processingFUJITSU TEN LTD·Filed 2005·Granted May 20, 2008·27 cites·9 claims
- 1986US10283874B2Antenna apparatusFUJITSU TEN LTD·Filed 2017·Granted May 7, 2019·6 cites·16 claims
- 2086US8552445B2Semiconductor light emitting device and method for manufacturing the sameWAKAI YOHEI·Filed 2008·Granted Oct 8, 2013·11 cites·26 claims
- 2186US8274651B2Method of inspecting a semiconductor device and an apparatus thereofHAMAMATSU AKIRA·Filed 2011·Granted Sep 25, 2012·3 cites·14 claims
- 2286US8169606B2Appearance inspection apparatusOKA KENJI·Filed 2010·Granted May 1, 2012·4 cites·27 claims
- 2385US7643138B2Method of inspecting a semiconductor device and an apparatus thereofHITACHI LTD·Filed 2008·Granted Jan 5, 2010·5 cites·12 claims
- 2485US7612706B2Monopulse radar apparatus and antenna switchFUJITSU TEN LTD·Filed 2005·Granted Nov 3, 2009·25 cites·36 claims
- 2585US7221486B2Method and apparatus for picking up 2D image of an object to be sensedHITACHI LTD·Filed 2002·Granted May 22, 2007·33 cites·17 claims
- 2682US8699017B2Appearance inspection apparatusHITACHI HIGH TECH CORP·Filed 2013·Granted Apr 15, 2014·2 cites·7 claims
- 2782US8040503B2Method of inspecting a semiconductor device and an apparatus thereofHITACHI LTD·Filed 2010·Granted Oct 18, 2011·2 cites·12 claims
- 2882US7512259B2Defect inspection method and apparatusHITACHI LTD·Filed 2007·Granted Mar 31, 2009·7 cites·4 claims
- 2980US8462327B2Appearance inspection apparatusOKA KENJI·Filed 2012·Granted Jun 11, 2013·2 cites·8 claims
- 3080US7786036B2Dielectric porcelain composition, and method for manufacturing capacitor using the samePANASONIC CORP·Filed 2006·Granted Aug 31, 2010·8 cites·2 claims
- 3180US7061600B2Manufacturing method of semiconductor substrate and method and apparatus for inspecting defects of patterns on an object to be inspectedRENESAS TECH CORP·Filed 2002·Granted Jun 13, 2006·11 cites·37 claims
- 3279US8831899B2Inspecting apparatus and an inspecting methodNEMOTO KAZUNORI·Filed 2009·Granted Sep 9, 2014·9 cites·30 claims
- 3379US7092095B2Method and apparatus for observing and inspecting defectsHITACHI LTD·Filed 2004·Granted Aug 15, 2006·11 cites·14 claims
- 3478US7916929B2Defect inspection method and apparatusHITACHI LTD·Filed 2009·Granted Mar 29, 2011·5 cites·16 claims
- 3574US7460220B2Manufacturing method of semiconductor substrate and method and apparatus for inspecting defects of patterns of an object to be inspectedRENESAS TECH CORP·Filed 2006·Granted Dec 2, 2008·2 cites·11 claims
- 3674US7397419B2Radar apparatus and failure detection method thereofFUJITSU TEN LTD·Filed 2007·Granted Jul 8, 2008·10 cites·5 claims
- 3773US7499162B2Method and apparatus for observing and inspecting defectsHITACHI LTD·Filed 2006·Granted Mar 3, 2009·2 cites·8 claims
- 3871US7180584B2Manufacturing method of semiconductor substrate and method and apparatus for inspecting defects of patterns of an object to be inspectedRENESAS TECH CORP·Filed 2003·Granted Feb 20, 2007·5 cites·25 claims
- 3971US5914428AProcess for preparation of isocyanate compoundsDAICEL CHEM·Filed 1995·Granted Jun 22, 1999·14 cites·34 claims
- 4070US8115043B2Method for producing cyclic olefin compoundTAKAI HIDEYUKI·Filed 2007·Granted Feb 14, 2012·2 cites·8 claims
- 4169US5789614AProcess for preparation of aliphatic diisocyanate compoundsDAICEL CHEM·Filed 1997·Granted Aug 4, 1998·11 cites·16 claims
- 4268US10032029B2Verifying integrity of backup file in a multiple operating system environmentLENOVO SINGAPORE PTE LTD·Filed 2014·Granted Jul 24, 2018·2 cites·18 claims
- 4368US8503737B2Visual line estimating apparatusOKA KENJI·Filed 2011·Granted Aug 6, 2013·4 cites·8 claims
- 4467US8810642B2Pupil detection device and pupil detection methodTSUKIZAWA SOTARO·Filed 2011·Granted Aug 19, 2014·4 cites·4 claims
- 4567US7729516B2Ranging device utilizing image processingFUJITSU TEN LTD·Filed 2007·Granted Jun 1, 2010·6 cites·1 claims
- 4666US9159868B2Method for manufacturing semiconductor light emitting deviceNICHIA CORP·Filed 2014·Granted Oct 13, 2015·0 cites·12 claims
- 4766US8649583B2Pupil detection device and pupil detection methodTSUKIZAWA SOTARO·Filed 2011·Granted Feb 11, 2014·3 cites·11 claims
- 4866US6947276B2Process for producing laminated ceramic capacitorMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2003·Granted Sep 20, 2005·8 cites·3 claims
- 4962US2009141264A1Method and Apparatus for Observing and Inspecting DefectsHITACHI LTD·Filed 2009·Application pending·0 cites
- 5061US10608332B2Microstrip antennaDENSO TEN LTD·Filed 2017·Granted Mar 31, 2020·1 cites·1 claims
Showing the top 50 of 80 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →