Inventor · disambiguated record
Ken Ozawa
Also filed as: OZAWA KEN · OZAWA KEN-ICHI
55 granted patents·9 pending applications·877 citations·filing 1988–2024
98Inventor score
Top patents by PatentIndex Score
64 records- 0194US9064763B2Solid-state imaging element, solid-state imaging device, imaging apparatus, and method of manufacturing polarizing elementOZAWA KEN·Filed 2011·Granted Jun 23, 2015·16 cites·19 claims
- 0294US5534970AScanning exposure apparatusNIKON CORP·Filed 1994·Granted Jul 9, 1996·200 cites·18 claims
- 0392US9294697B2Imaging apparatus and camera systemSONY CORP·Filed 2014·Granted Mar 22, 2016·8 cites·18 claims
- 0491US10461106B2Imaging element and camera systemSONY CORP·Filed 2016·Granted Oct 29, 2019·6 cites·18 claims
- 0591US9508662B2Optical semiconductor deviceRENESAS ELECTRONICS CORP·Filed 2015·Granted Nov 29, 2016·9 cites·9 claims
- 0691US6730925B1Method and apparatus for projection exposure and device manufacturing methodNIKON CORP·Filed 2000·Granted May 4, 2004·40 cites·19 claims
- 0790US5728495AScanning exposure method and apparatusNIKON CORP·Filed 1995·Granted Mar 17, 1998·68 cites·28 claims
- 0889US6721039B2Exposure method, exposure apparatus and device producing methodNIKON CORP·Filed 2001·Granted Apr 13, 2004·45 cites·31 claims
- 0985US9312327B2Semiconductor deviceRENESAS ELECTRONICS CORP·Filed 2015·Granted Apr 12, 2016·5 cites·6 claims
- 1084US5473412AEnergy amount controlling methodNIKON CORP·Filed 1995·Granted Dec 5, 1995·57 cites·11 claims
- 1183US6501535B1Exposure control method and apparatusNIKON CORP·Filed 2000·Granted Dec 31, 2002·22 cites·44 claims
- 1282US10295743B2Optical semiconductor device, and method for producing the sameRENESAS ELECTRONICS CORP·Filed 2015·Granted May 21, 2019·4 cites·13 claims
- 1382US9432598B2Imaging apparatus and camera systemSONY CORP·Filed 2016·Granted Aug 30, 2016·2 cites·20 claims
- 1482USRE37309EScanning exposure apparatusNIPPON KOGAKU KK·Filed 1998·Granted Aug 7, 2001·57 cites·60 claims
- 1581US9523803B2Image capturing element and image capturing apparatus for removing infrared components from lightSONY CORP·Filed 2013·Granted Dec 20, 2016·4 cites·17 claims
- 1678US5574537AApparatus for controlling light quantity using acousto-optic modulator for selecting 0th-order diffracted beamNIKON CORP·Filed 1994·Granted Nov 12, 1996·32 cites·25 claims
- 1777US10955360B2Structured illumination-based inspection apparatus and inspection method, and semiconductor device fabrication method including structured illumination-based inspection methodSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted Mar 23, 2021·2 cites·12 claims
- 1877US9817485B2Display control device, method, and programOZAWA KEN·Filed 2012·Granted Nov 14, 2017·5 cites·17 claims
- 1977US5929977AExposure apparatus and exposure quantity control methodNIKON CORP·Filed 1997·Granted Jul 27, 1999·31 cites·12 claims
- 2076US9888193B2Imaging apparatus and camera systemSONY CORP·Filed 2017·Granted Feb 6, 2018·1 cites·30 claims
- 2174US7075561B2Image printing apparatus and color misregistration correction methodKONICA MINOLTA BUSINESS TECH·Filed 2004·Granted Jul 11, 2006·17 cites·13 claims
- 2273US5659383AExposure apparatus and exposure quantity control methodNIKON CORP·Filed 1996·Granted Aug 19, 1997·30 cites·10 claims
- 2371US8675282B2Solid-state imaging device and method for manufacturing the sameOZAWA KEN·Filed 2009·Granted Mar 18, 2014·4 cites·23 claims
- 2471US6538723B2Scanning exposure in which an object and pulsed light are moved relatively, exposing a substrate by projecting a pattern on a mask onto the substrate with pulsed light from a light source, light sources therefor, and methods of manufacturingNIKON CORP·Filed 1999·Granted Mar 25, 2003·30 cites·16 claims
- 2571US6154270AScanning exposure method and apparatusNIKON CORP·Filed 1999·Granted Nov 28, 2000·26 cites·38 claims
- 2669US8092960B2Exposing mask and production method therefor and exposing methodOZAWA KEN·Filed 2008·Granted Jan 10, 2012·2 cites·5 claims
- 2767US7379639B2Lens assembly and electronic apparatus using the sameSONY CORP·Filed 2006·Granted May 27, 2008·6 cites·2 claims
- 2867US5044891AVariable displacement diaphragm pumpOZAWA R & D INC·Filed 1989·Granted Sep 3, 1991·23 cites·53 claims
- 2966US10429315B2Imaging apparatus and imaging methodSAMSUNG ELECTRONICS CO LTD·Filed 2018·Granted Oct 1, 2019·1 cites·8 claims
- 3066US5898480AExposure methodNIKON CORP·Filed 1996·Granted Apr 27, 1999·21 cites·61 claims
- 3165US11054304B2Imaging device and methodSONY CORP·Filed 2015·Granted Jul 6, 2021·1 cites·24 claims
- 3265US10491841B2Imaging apparatus and camera system with optical memberSONY CORP·Filed 2019·Granted Nov 26, 2019·0 cites·16 claims
- 3365US6124064ALight exposure controlling methodNIKON CORP·Filed 1998·Granted Sep 26, 2000·23 cites·25 claims
- 3465US4856966AVariable displacement diaphragm pumpOZAWA R & D INC·Filed 1988·Granted Aug 15, 1989·22 cites·2 claims
- 3564US7525733B2Solid-state imaging device and method for manufacturing the sameSONY CORP·Filed 2005·Granted Apr 28, 2009·2 cites·11 claims
- 3663US5965308AMethod of controlling exposureNIPPON KOGAKU KK·Filed 1996·Granted Oct 12, 1999·22 cites·30 claims
- 3763US2020083269A1Imaging element and camera systemSONY CORP·Filed 2019·Application pending·0 cites
- 3862US11733176B2Inspection device and method of measuring wavefront aberrationSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Aug 22, 2023·0 cites·20 claims
- 3962US11031423B2Imaging element and camera systemSONY CORP·Filed 2020·Granted Jun 8, 2021·0 cites·18 claims
- 4062US10264198B2Imaging apparatus and camera system for improving image qualitySONY CORP·Filed 2017·Granted Apr 16, 2019·0 cites·22 claims
- 4162US7655377B2Antireflection film and exposure methodSONY CORP·Filed 2006·Granted Feb 2, 2010·2 cites·15 claims
- 4262US7199042B2Semiconductor device with multi-layered wiring arrangement including reinforcing patterns, and production method for manufacturing such semiconductor deviceNEC ELECTRONICS CORP·Filed 2004·Granted Apr 3, 2007·10 cites·17 claims
- 4360US9648259B2Imaging apparatus and camera system for improving image qualitySONY CORP·Filed 2016·Granted May 9, 2017·0 cites·16 claims
- 4459US9736407B2Imaging apparatus and camera system with light-transmitting laminated materialSONY CORP·Filed 2016·Granted Aug 15, 2017·0 cites·16 claims
- 4559US7438996B2Mask correcting methodSONY CORP·Filed 2003·Granted Oct 21, 2008·4 cites·4 claims
- 4659US6924206B2Method of manufacturing a semiconductor capacitive element in a semiconductor deviceNEC ELECTRONICS CORP·Filed 2004·Granted Aug 2, 2005·7 cites·5 claims
- 4758US2024272245A1Semiconductor manufacturing device and semiconductor manufacturing methodSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 4857US7879513B2Method for correcting maskSONY CORP·Filed 2008·Granted Feb 1, 2011·0 cites·6 claims
- 4957US2014145285A1Solid-state imaging device and method for manufacturing the sameSONY CORP·Filed 2014·Application pending·0 cites
- 5052US9670532B2Chemical sensor, chemical sensor module, biomolecule detection apparatus, and biomolecule detection methodSONY CORP·Filed 2012·Granted Jun 6, 2017·0 cites·19 claims
Showing the top 50 of 64 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →