Inventor · disambiguated record
Kenichi Shinbo
Also filed as: SHINBO KENICHI
9 granted patents·2 pending applications·63 citations·filing 2000–2011
85Inventor score
Top patents by PatentIndex Score
11 records- 0184US7476850B2Method and its apparatus for mass spectrometryHITACHI HIGH TECH CORP·Filed 2006·Granted Jan 13, 2009·9 cites·21 claims
- 0284US6411104B1Apparatus and method for detecting electromagnetic wave source, and method for analyzing the sameHITACHI LTD·Filed 2000·Granted Jun 25, 2002·29 cites·17 claims
- 0374US7928365B2Method and apparatus for mass spectrometryHITACHI HIGH TECH CORP·Filed 2005·Granted Apr 19, 2011·3 cites·6 claims
- 0466US6617860B2Apparatus and method for detecting electromagnetic wave source, and method for analyzing the sameHITACHI LTD·Filed 2002·Granted Sep 9, 2003·11 cites·18 claims
- 0553US7890074B2Data acquisition systemHITACHI HIGH TECH CORP·Filed 2007·Granted Feb 15, 2011·0 cites·10 claims
- 0648US7132997B2Narrow-directivity electromagnetic-field antenna probe, and electromagnetic-field measurement apparatus, electric-current distribution search-for apparatus or electrical-wiring diagnosis apparatus using this antenna probeHITACHI LTD·Filed 2003·Granted Nov 7, 2006·6 cites·8 claims
- 0745US7085982B2Pulse generation circuit and semiconductor tester that uses the pulse generation circuitHITACHI LTD·Filed 2003·Granted Aug 1, 2006·5 cites·18 claims
- 0843US2011192970A1Method and apparatus for mass spectrometryOONISHI FUJIO·Filed 2011·Application pending·0 cites
- 0940US2008244329A1Apparatus diagnosing method, apparatus diagnosis module, and apparatus mounted with apparatus diagnosis moduleSHINBO KENICHI·Filed 2008·Application pending·0 cites
- 1032US6768953B2Test apparatusHITACHI LTD·Filed 2002·Granted Jul 27, 2004·0 cites·7 claims
- 1132US6697755B2Test apparatusHITACHI LTD·Filed 2002·Granted Feb 24, 2004·0 cites·2 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →