Inventor · disambiguated record
Kengo Takemasa
Also filed as: TAKEMASA KENGO
16 granted patents·1 pending application·58 citations·filing 2005–2023
91Inventor score
Top patents by PatentIndex Score
17 records- 0196US11854952B2Semiconductor device and measurement deviceLAPIS SEMICONDUCTOR CO LTD·Filed 2022·Granted Dec 26, 2023·2 cites·4 claims
- 0291US8921987B2Semiconductor device and measurement device having an oscillatorLAPIS SEMICONDUCTOR CO LTD·Filed 2013·Granted Dec 30, 2014·8 cites·20 claims
- 0390US7571647B2Package structure for an acceleration sensorOKI SEMICONDUCTOR CO LTD·Filed 2005·Granted Aug 11, 2009·26 cites·21 claims
- 0485US12347757B2Semiconductor device and measurement deviceLAPIS SEMICONDUCTOR CO LTD·Filed 2023·Granted Jul 1, 2025·0 cites·4 claims
- 0585US9197217B2Semiconductor device, measurement device, and correction methodLAPIS SEMICONDUCTOR CO LTD·Filed 2013·Granted Nov 24, 2015·5 cites·17 claims
- 0681US7615835B2Package for semiconductor acceleration sensorOKI SEMICONDUCTOR CO LTD·Filed 2006·Granted Nov 10, 2009·11 cites·10 claims
- 0778US9584134B2Correcting temperature based oscillation frequency errors in semiconductor deviceLAPIS SEMICONDUCTOR CO LTD·Filed 2015·Granted Feb 28, 2017·2 cites·15 claims
- 0875US10243515B2Semiconductor device and measurement deviceLAPIS SEMICONDUCTOR CO LTD·Filed 2017·Granted Mar 26, 2019·2 cites·15 claims
- 0973US9787250B2Semiconductor device and measurement deviceLAPIS SEMICONDUCTOR CO LTD·Filed 2016·Granted Oct 10, 2017·2 cites·10 claims
- 1071US11309234B2Semiconductor device having an oscillator and an associated integrated circuitLAPIS SEMICONDUCTOR CO LTD·Filed 2020·Granted Apr 19, 2022·0 cites·1 claims
- 1159US9257377B2Semiconductor device and measurement device having an oscillatorLAPIS SEMICONDUCTOR CO LTD·Filed 2014·Granted Feb 9, 2016·0 cites·13 claims
- 1258US10411715B2Semiconductor device, measurement device, and correction methodLAPIS SEMICONDUCTOR CO LTD·Filed 2017·Granted Sep 10, 2019·0 cites·13 claims
- 1357US9838022B2Semiconductor device with oscillation frequency error correctionLAPIS SEMICONDUCTOR CO LTD·Filed 2017·Granted Dec 5, 2017·0 cites·14 claims
- 1456US10615108B2Semiconductor device and measurement deviceLAPIS SEMICONDUCTOR CO LTD·Filed 2016·Granted Apr 7, 2020·0 cites·15 claims
- 1555US10622944B2Semiconductor device and measurement deviceLAPIS SEMICONDUCTOR CO LTD·Filed 2019·Granted Apr 14, 2020·0 cites·4 claims
- 1652US9230890B2Semiconductor device and measurement deviceLAPIS SEMICONDUCTOR CO LTD·Filed 2013·Granted Jan 5, 2016·0 cites·16 claims
- 1747US2009203171A1Semiconductor device fabricating methodOKI SEMICONDUCTOR CO LTD·Filed 2008·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →