Inventor · disambiguated record
Kenji Takubo
Also filed as: TAKUBO KENJI
26 granted patents·6 pending applications·56 citations·filing 2001–2022
93Inventor score
Top patents by PatentIndex Score
32 records- 0193US10267618B2Defect detection method and defect detection apparatusSHIMADZU CORP·Filed 2017·Granted Apr 23, 2019·7 cites·13 claims
- 0286US11226294B2Defect inspection apparatusSHIMADZU CORP·Filed 2020·Granted Jan 18, 2022·2 cites·24 claims
- 0384US11193887B2Defect detection method and deviceSHIMADZU CORP·Filed 2018·Granted Dec 7, 2021·2 cites·11 claims
- 0484US11181510B2Inspection apparatus and inspection methodSHIMADZU CORP·Filed 2019·Granted Nov 23, 2021·2 cites·13 claims
- 0583US10317190B2Vibration measurement deviceSHIMADZU CORP·Filed 2018·Granted Jun 11, 2019·2 cites·18 claims
- 0683US7394484B2Photographic apparatus and photographic method using sameSHIMADZU CORP·Filed 2003·Granted Jul 1, 2008·30 cites·17 claims
- 0778US10429172B2Defect detection method and defect detection deviceSHIMADZU CORP·Filed 2018·Granted Oct 1, 2019·1 cites·17 claims
- 0875US9030582B2Solid state image sensor and method for driving the sameSUGAWA SHIGETOSHI·Filed 2011·Granted May 12, 2015·3 cites·8 claims
- 0974US10942152B2Defect inspection device and methodSHIMADZU CORP·Filed 2016·Granted Mar 9, 2021·1 cites·8 claims
- 1067US12099000B2Defect detection device and defect detection methodSHIMADZU CORP·Filed 2022·Granted Sep 24, 2024·0 cites·9 claims
- 1165US7911610B2Optical measuring deviceSHIMADZU CORP·Filed 2006·Granted Mar 22, 2011·2 cites·7 claims
- 1259US11982641B2Method and device for examining clinched portion of tubular bodySHIMADZU CORP·Filed 2020·Granted May 14, 2024·0 cites·8 claims
- 1358US12345653B2Defect inspection apparatusSHIMADZU CORP·Filed 2020·Granted Jul 1, 2025·0 cites·25 claims
- 1458US12188769B2Defect inspection device and defect inspection methodSHIMADZU CORP·Filed 2020·Granted Jan 7, 2025·0 cites·11 claims
- 1558US11977032B2Displacement measurement device and defect detection deviceSHIMADZU CORP·Filed 2019·Granted May 7, 2024·0 cites·10 claims
- 1658US9429471B2Photodiode array for spectrometric measurements and spectrometric measurement systemSHIMADZU CORP·Filed 2013·Granted Aug 30, 2016·0 cites·10 claims
- 1758US8313628B2Method and apparatus for evaluating dielectrophoretic intensity of microparticleTSUNAZAWA YOSHIO·Filed 2006·Granted Nov 20, 2012·1 cites·6 claims
- 1858US7432971B2In-situ storage image sensor and in-situ storage image pickup apparatusSHIMADZU CORP·Filed 2003·Granted Oct 7, 2008·3 cites·20 claims
- 1955US11391700B2Defect detection deviceSHIMADZU CORP·Filed 2019·Granted Jul 19, 2022·0 cites·6 claims
- 2054US12360052B2Defect inspection apparatus and defect inspection methodSHIMADZU CORP·Filed 2020·Granted Jul 15, 2025·0 cites·10 claims
- 2154US2023304787A1Defect detection device and defect detection methodSHIMADZU CORP·Filed 2022·Application pending·0 cites
- 2253US11815493B2Defect inspection apparatus and defect inspection methodSHIMADZU CORP·Filed 2018·Granted Nov 14, 2023·0 cites·6 claims
- 2352US12111266B2Vibration measurement deviceSHIMADZU CORP·Filed 2018·Granted Oct 8, 2024·0 cites·2 claims
- 2452US2023114484A1Inspection system, image processing method, and defect inspection deviceSHIMADZU CORP·Filed 2022·Application pending·0 cites
- 2547US11790513B2Defect inspection apparatus and defect inspection methodSHIMADZU CORP·Filed 2019·Granted Oct 17, 2023·0 cites·19 claims
- 2647US11774746B2Interference image imaging apparatusSHIMADZU CORP·Filed 2020·Granted Oct 3, 2023·0 cites·14 claims
- 2747US8530947B2Solid-state image sensorKONDO YASUSHI·Filed 2010·Granted Sep 10, 2013·0 cites·18 claims
- 2845US2004141300A1Fluorescence detection method and fluorescence detection deviceFiled 2003·Application pending·0 cites
- 2943US2015296160A1Linear image sensor and driving method thereforSHIMADZU CORP·Filed 2013·Application pending·0 cites
- 3041US2022051390A1Defect inspection apparatus and defect inspection methodSHIMADZU CORP·Filed 2018·Application pending·0 cites
- 3135US2002060742A1Solid state imaging deviceSHIMADZU CORP·Filed 2001·Application pending·0 cites
- 3230US8508739B2Gas concentration measurement deviceHOSHINO YOUSUKE·Filed 2011·Granted Aug 13, 2013·0 cites·4 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →