Inventor · disambiguated record
Kent R. Townley
Also filed as: TOWNLEY KENT · TOWNLEY KENT R · TOWNLEY KENT RICHARD
11 granted patents·2 pending applications·193 citations·filing 1997–2018
90Inventor score
Top patents by PatentIndex Score
13 records- 0195US8996906B1Clock management blockTOWNLEY KENT R·Filed 2010·Granted Mar 31, 2015·61 cites·19 claims
- 0284US9954530B2Implementation of related clocksALTERA CORP·Filed 2015·Granted Apr 24, 2018·5 cites·22 claims
- 0384US6188260B1Master-slave flip-flop and methodAGILENT TECHNOLOGIES INC·Filed 1999·Granted Feb 13, 2001·60 cites·4 claims
- 0481US9000801B1Implementation of related clocksTABULA INC·Filed 2013·Granted Apr 7, 2015·5 cites·21 claims
- 0571US6069512ADynamic circuits and static latches with low power dissipationINTEL CORP·Filed 1997·Granted May 30, 2000·22 cites·4 claims
- 0657US6535989B1Input clock delayed by a plurality of elements that are connected to logic circuitry to produce a clock frequency having a rational multiple less than oneHEWLETT PACKARD CO·Filed 1999·Granted Mar 18, 2003·21 cites·22 claims
- 0753US2018287616A1Clock management blockALTERA CORP·Filed 2018·Application pending·0 cites
- 0850US10014865B2Clock management blockALTERA CORP·Filed 2015·Granted Jul 3, 2018·0 cites·20 claims
- 0940US6195279B1Increased content addressable memory (CAM) density and performanceINTEL CORP·Filed 1999·Granted Feb 27, 2001·7 cites·15 claims
- 1035US6317801B1System for post-driving and pre-driving bus agents on a terminated data busINTEL CORP·Filed 1998·Granted Nov 13, 2001·7 cites·19 claims
- 1135US6300822B1On chip CMOS VLSI reference voltage with feedback for hysteresis noise marginHEWLETT PACKARD CO·Filed 1998·Granted Oct 9, 2001·5 cites·31 claims
- 1233US2004085082A1High -frequency scan testability with low-speed testersFiled 2002·Application pending·0 cites
- 1330US6703882B1Dynamic circuits and static latches with low power dissipationINTEL CORP·Filed 1999·Granted Mar 9, 2004·0 cites·11 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →