Inventor · disambiguated record
Kezhakkedath R. Udayakumar
Also filed as: UDAYAKUMAR KEZHAKKEDATH R · UDAYAKUMAR KEZHAKKEDATH RAMUNNI
25 granted patents·1 pending application·172 citations·filing 2003–2021
95Inventor score
Files withTEXAS INSTRUMENTS INC20UDAYAKUMAR KEZHAKKEDATH R3SUMMERFELT SCOTT R2CELII FRANCIS GABRIEL1
Top patents by PatentIndex Score
26 records- 0195US8440508B2Hydrogen barrier for ferroelectric capacitorsUDAYAKUMAR KEZHAKKEDATH R·Filed 2010·Granted May 14, 2013·32 cites·3 claims
- 0292US7935543B2Method of forming PZT ferroelectric capacitors for integrated circuitsTEXAS INSTRUMENTS INC·Filed 2009·Granted May 3, 2011·20 cites·20 claims
- 0389US8496842B2MEMS device fabricated with integrated circuitUDAYAKUMAR KEZHAKKEDATH R·Filed 2011·Granted Jul 30, 2013·11 cites·16 claims
- 0486US7220600B2Ferroelectric capacitor stack etch cleaning methodsTEXAS INSTRUMENTS INC·Filed 2004·Granted May 22, 2007·35 cites·20 claims
- 0581US9704804B1Oxidation resistant barrier metal process for semiconductor devicesTEXAS INSTRUMENTS INC·Filed 2015·Granted Jul 11, 2017·4 cites·20 claims
- 0680US8723241B2MEMS device fabricated with integrated circuitTEXAS INSTRUMENTS INC·Filed 2013·Granted May 13, 2014·4 cites·4 claims
- 0778US8058677B2Stress buffer layer for ferroelectric random access memorySUMMERFELT SCOTT R·Filed 2009·Granted Nov 15, 2011·6 cites·9 claims
- 0878US7304881B2Ferroelectric memory with wide operating voltage and multi-bit storage per cellTEXAS INSTRUMENTS INC·Filed 2004·Granted Dec 4, 2007·22 cites·6 claims
- 0975US8093070B2Method for leakage reduction in fabrication of high-density FRAM arraysCELII FRANCIS GABRIEL·Filed 2007·Granted Jan 10, 2012·8 cites·19 claims
- 1074US7772014B2Semiconductor device having reduced single bit fails and a method of manufacture thereofTEXAS INSTRUMENTS INC·Filed 2007·Granted Aug 10, 2010·6 cites·21 claims
- 1171US7985603B2Ferroelectric capacitor manufacturing processTEXAS INSTRUMENTS INC·Filed 2008·Granted Jul 26, 2011·4 cites·18 claims
- 1270US8071430B2Stress buffer layer for ferroelectric random access memorySUMMERFELT SCOTT R·Filed 2011·Granted Dec 6, 2011·2 cites·10 claims
- 1365US7799582B2Mitigation of edge degradation in ferroelectric memory devices through plasma etch cleanTEXAS INSTRUMENTS INC·Filed 2009·Granted Sep 21, 2010·1 cites·6 claims
- 1464US11849590B2Capacitor comprising a bismuth metal oxide-based lead titanate thin filmTEXAS INSTRUMENTS INC·Filed 2021·Granted Dec 19, 2023·0 cites·17 claims
- 1564US8778700B2Hydrogen barrier for ferroelectric capacitorsTEXAS INSTRUMENTS INC·Filed 2013·Granted Jul 15, 2014·1 cites·7 claims
- 1661US7425512B2Method for etching a substrate and a device formed using the methodTEXAS INSTRUMENTS INC·Filed 2003·Granted Sep 16, 2008·9 cites·20 claims
- 1759US8053252B2Mitigation of edge degradation in ferroelectric memory devices through plasma etch cleanTEXAS INSTRUMENTS INC·Filed 2009·Granted Nov 8, 2011·0 cites·7 claims
- 1853US11158642B2Capacitor comprising a bismuth metal oxide-based lead titanate thin filmTEXAS INSTRUMENTS INC·Filed 2018·Granted Oct 26, 2021·0 cites·16 claims
- 1953US10665543B2Oxidation resistant barrier metal process for semiconductor devicesTEXAS INSTRUMENTS INC·Filed 2018·Granted May 26, 2020·0 cites·14 claims
- 2053US7572698B2Mitigation of edge degradation in ferroelectric memory devices through plasma etch cleanTEXAS INSTRUMENTS INC·Filed 2006·Granted Aug 11, 2009·0 cites·16 claims
- 2153US7085150B2Methods for enhancing performance of ferroelectic memory with polarization treatmentTEXAS INSTRUMENTS INC·Filed 2004·Granted Aug 1, 2006·7 cites·20 claims
- 2252US8779485B2Hydrogen barrier for ferroelectric capacitorsUDAYAKUMAR KEZHAKKEDATH R·Filed 2012·Granted Jul 15, 2014·0 cites·7 claims
- 2351US10008450B2Oxidation resistant barrier metal process for semiconductor devicesTEXAS INSTRUMENTS INC·Filed 2017·Granted Jun 26, 2018·0 cites·15 claims
- 2448US9548377B2Thermal treatment for reducing transistor performance variation in ferroelectric memoriesTEXAS INSTRUMENTS INC·Filed 2014·Granted Jan 17, 2017·0 cites·18 claims
- 2547US7723199B2Method for cleaning post-etch noble metal residuesTEXAS INSTRUMENTS INC·Filed 2007·Granted May 25, 2010·0 cites·28 claims
- 2640US2010270601A1Semiconductor Device Having Reduced Single Bit Fails and a Method of Manufacture ThereofTEXAS INSTRUMENTS INC·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →