Inventor · disambiguated record
Kevin G. Werhane
Also filed as: WERHANE KEVIN G · WERHANE KEVIN GUSTAV
20 granted patents·3 pending applications·15 citations·filing 2017–2025
90Inventor score
Top patents by PatentIndex Score
23 records- 0194US10330726B2Apparatuses including test segment circuits having latch circuits for testing a semiconductor dieMICRON TECHNOLOGY INC·Filed 2017·Granted Jun 25, 2019·6 cites·10 claims
- 0292US11183260B1Transmit line monitoring circuitry, and related methods, devices, and systemsMICRON TECHNOLOGY INC·Filed 2020·Granted Nov 23, 2021·4 cites·20 claims
- 0382US11727967B2Apparatuses and methods including dice latches in a semiconductor deviceMICRON TECHNOLOGY INC·Filed 2022·Granted Aug 15, 2023·1 cites·10 claims
- 0480US2025021435A1Apparatuses, systems, and methods for error correctionLODESTAR LICENSING GROUP LLC·Filed 2024·Application pending·0 cites
- 0578US10663513B2Apparatuses including test segment circuits having latch circuits for testing a semiconductor dieMICRON TECHNOLOGY INC·Filed 2019·Granted May 26, 2020·1 cites·20 claims
- 0677US11263078B2Apparatuses, systems, and methods for error correctionMICRON TECHNOLOGY INC·Filed 2020·Granted Mar 1, 2022·1 cites·20 claims
- 0773US12394456B2Apparatuses and methods including dice latches in a semiconductor deviceMICRON TECHNOLOGY INC·Filed 2023·Granted Aug 19, 2025·0 cites·13 claims
- 0873US2025284435A1Apparatus with calibration input mechanism and methods for operating the sameMICRON TECHNOLOGY INC·Filed 2025·Application pending·0 cites
- 0971US12333191B2Apparatus with calibration input mechanism and methods for operating the sameMICRON TECHNOLOGY INC·Filed 2023·Granted Jun 17, 2025·0 cites·20 claims
- 1071US12079076B2Apparatuses, systems, and methods for error correctionMICRON TECHNOLOGY INC·Filed 2022·Granted Sep 3, 2024·0 cites·15 claims
- 1167US10825544B2Configurable post-package repairMICRON TECHNOLOGY INC·Filed 2019·Granted Nov 3, 2020·2 cites·20 claims
- 1257US11955160B2Asynchronous signal to command timing calibration for testing accuracyMICRON TECHNOLOGY INC·Filed 2022·Granted Apr 9, 2024·0 cites·20 claims
- 1357US11675589B2Serial interfaces with shadow registers, and associated systems, devices, and methodsMICRON TECHNOLOGY INC·Filed 2021·Granted Jun 13, 2023·0 cites·20 claims
- 1457US11054468B2Segmented digital die ringMICRON TECHNOLOGY INC·Filed 2018·Granted Jul 6, 2021·0 cites·19 claims
- 1557US2025336464A1Radiation monitoring using accumulated parity of non-protected latchesMICRON TECHNOLOGY INC·Filed 2025·Application pending·0 cites
- 1656US12100476B2Test mode security circuitMICRON TECHNOLOGY INC·Filed 2022·Granted Sep 24, 2024·0 cites·20 claims
- 1753US12100467B2Systems and methods for testing redundant fuse latches in a memory deviceMICRON TECHNOLOGY INC·Filed 2022·Granted Sep 24, 2024·0 cites·25 claims
- 1853US11342042B2Interconnected command/address resourcesMICRON TECHNOLOGY INC·Filed 2020·Granted May 24, 2022·0 cites·20 claims
- 1945US11081166B1Memory device random option inversionMICRON TECHNOLOGY INC·Filed 2020·Granted Aug 3, 2021·0 cites·20 claims
- 2044US10930327B1Memory read maskingMICRON TECHNOLOGY INC·Filed 2020·Granted Feb 23, 2021·0 cites·21 claims
- 2141US11645134B2Apparatuses and methods for fuse error detectionMICRON TECHNOLOGY INC·Filed 2019·Granted May 9, 2023·0 cites·21 claims
- 2241US10410994B2Single interconnect index pointer for stacked die address encodingMICRON TECHNOLOGY INC·Filed 2017·Granted Sep 10, 2019·0 cites·22 claims
- 2339US10984884B2Configurable associated repair addresses and circuitry for a memory deviceMICRON TECHNOLOGY INC·Filed 2019·Granted Apr 20, 2021·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →