Inventor · disambiguated record
Khee Aik Christopher Lee
Also filed as: LEE KHEE AIK CHRISTOPHER · LEE KHEE L
1 granted patent·1 pending application·6 citations·filing 2004–2015
28Inventor score
Top patents by PatentIndex Score
2 records- 0181US9897561B2Method of detecting defects in an object based on active thermography and a system thereofAGENCY SCIENCE TECH & RES·Filed 2015·Granted Feb 20, 2018·6 cites·20 claims
- 0227US2005289398A1Testing method and system including processing of simulation data and test patternsTIW LEE F·Filed 2004·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →