Inventor · disambiguated record
Kiyotaka Horie
Also filed as: HORIE KIYOTAKA
2 granted patents·7 pending applications·25 citations·filing 2011–2013
53Inventor score
Top patents by PatentIndex Score
9 records- 0190US8547545B2Method and apparatus for inspecting a surface of a substrateSASAZAWA HIDEAKI·Filed 2011·Granted Oct 1, 2013·25 cites·12 claims
- 0241US2014043603A1Surface inspecting apparatus having double recipe processing functionHITACHI HIGH TECH CORP·Filed 2013·Application pending·0 cites
- 0341US2014071442A1Optical surface defect inspection apparatus and optical surface defect inspection methodHITACHI HIGH TECH CORP·Filed 2013·Application pending·0 cites
- 0440US2013258328A1Disk surface inspection method and disk surface inspection deviceHITACHI HIGH TECH CORP·Filed 2013·Application pending·0 cites
- 0539US2011272096A1Pattern shape inspection instrument and pattern shape inspection method, instrument for inspecting stamper for patterned media and method of inspecting stamper for patterned media, and patterned media disk manufacturing lineHITACHI HIGH TECH CORP·Filed 2011·Application pending·0 cites
- 0639US2013077092A1Substrate surface defect inspection method and inspection deviceSASAZAWA HIDEAKI·Filed 2012·Application pending·0 cites
- 0735US2012287426A1Pattern inspection method and device for sameSASAZAWA HIDEAKI·Filed 2011·Application pending·0 cites
- 0835US2012320367A1Inspection method and device for sameYANAKA YU·Filed 2011·Application pending·0 cites
- 0934US8873031B2Method and apparatus for inspecting surface of a diskHITACHI HIGH TECH CORP·Filed 2013·Granted Oct 28, 2014·0 cites·10 claims
Join the waitlist — get patent alerts
Get an alert when Kiyotaka Horie files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →