Inventor · disambiguated record
Kiyofumi Kawamoto
Also filed as: KAWAMOTO KIYOFUMI
4 granted patents·77 citations·filing 1993–1995
75Inventor score
Top patents by PatentIndex Score
4 records- 0184US5453994ASemiconductor test system, semiconductor test method, method of wiring pattern formation and semiconductor integrated circuitMITSUBISHI ELECTRIC ENG·Filed 1993·Granted Sep 26, 1995·57 cites·14 claims
- 0241US5717622ASelecting circuit including circuits having different time constants to which each of a plurality of input signals is applied, and adding circuit using the sameMITSUBISHI ELECTRIC CORP·Filed 1995·Granted Feb 10, 1998·15 cites·15 claims
- 0331US5740088AControl signal generating device generating various control signals using storage unit having small storage capacityMITSUBISHI ELECTRIC CORP·Filed 1995·Granted Apr 14, 1998·4 cites·12 claims
- 0429US5729759AData processing apparatus for performing cumulative processing on time series dataMITSUBISHI ELECTRIC CORP·Filed 1995·Granted Mar 17, 1998·1 cites·20 claims
Join the waitlist — get patent alerts
Get an alert when Kiyofumi Kawamoto files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →