Inventor · disambiguated record
Kiyoshi Mikami
Also filed as: MIKAMI KIYOSHI
3 granted patents·58 citations·filing 1998–2011
69Inventor score
Top patents by PatentIndex Score
3 records- 0165US7941720B2Scan test circuit and scan test control methodRENESAS ELECTRONICS CORP·Filed 2008·Granted May 10, 2011·5 cites·11 claims
- 0261US6236696B1Digital PLL circuitNEC CORP·Filed 1998·Granted May 22, 2001·52 cites·19 claims
- 0352US8145964B2Scan test circuit and scan test control methodMIKAMI KIYOSHI·Filed 2011·Granted Mar 27, 2012·1 cites·11 claims
Join the waitlist — get patent alerts
Get an alert when Kiyoshi Mikami files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →