Inventor · disambiguated record
Kiyoshi Murakami
Also filed as: MURAKAMI KIYOSHI
14 granted patents·5 pending applications·111 citations·filing 1995–2025
91Inventor score
Files withOMRON TATEISI ELECTRONICS CO13MORIROKU TECH COMPANY LTD3GE MEDICAL SYS GLOBAL TECH CO LLC1ISHIBA MASATO1MITSUI BUSSAN1
Top patents by PatentIndex Score
19 records- 0189US7394084B2Method of generating image and illumination device for inspecting substrateOMRON TATEISI ELECTRONICS CO·Filed 2005·Granted Jul 1, 2008·20 cites·12 claims
- 0287US6947151B2Surface state inspecting method and substrate inspecting apparatusOMRON TATEISI ELECTRONICS CO·Filed 2003·Granted Sep 20, 2005·34 cites·7 claims
- 0385US11180065B2Beverage container holding deviceMORIROKU TECH COMPANY LTD·Filed 2020·Granted Nov 23, 2021·2 cites·11 claims
- 0479US7310406B2Inspection method and system for and method of producing component mounting substrateOMRON TATEISI ELECTRONICS CO·Filed 2005·Granted Dec 18, 2007·8 cites·3 claims
- 0575US7505149B2Apparatus for surface inspection and method and apparatus for inspecting substrateOMRON TATEISI ELECTRONICS CO·Filed 2005·Granted Mar 17, 2009·9 cites·8 claims
- 0672US8351682B2X-ray examination region setting method, X-ray examination apparatus and X-ray examination region setting programOMRON TATEISI ELECTRONICS CO·Filed 2009·Granted Jan 8, 2013·3 cites·5 claims
- 0767US7512260B2Substrate inspection method and apparatusOMRON TATEISI ELECTRONICS CO·Filed 2005·Granted Mar 31, 2009·5 cites·6 claims
- 0863US2025262917A1Energy absorberMORIROKU TECH COMPANY LTD·Filed 2025·Application pending·0 cites
- 0962US7114249B2Substrate inspecting method and substrate inspecting apparatus using the methodOMRON TATEISI ELECTRONICS CO·Filed 2004·Granted Oct 3, 2006·9 cites·15 claims
- 1058US7822566B2Method, device and program for setting a reference value for substrate inspectionOMRON TATEISI ELECTRONICS CO·Filed 2007·Granted Oct 26, 2010·1 cites·5 claims
- 1157US7869644B2Methods of and apparatus for inspecting substrateOMRON TATEISI ELECTRONICS CO·Filed 2005·Granted Jan 11, 2011·1 cites·5 claims
- 1257US5674914AMethod and apparatus for reclamation of waste polyvinyl chlorideMITSUI BUSSAN·Filed 1995·Granted Oct 7, 1997·17 cites·10 claims
- 1356US7680320B2Image processing method, substrate inspection method, substrate inspection apparatus and method of generating substrate inspection dataOMRON TATEISI ELECTRONICS CO·Filed 2005·Granted Mar 16, 2010·2 cites·4 claims
- 1442US9783131B2Decorated molded articleMORIROKU TECH COMPANY LTD·Filed 2016·Granted Oct 10, 2017·0 cites·5 claims
- 1541US2011222655A1X-ray inspection apparatus, x-ray inspection method, x-ray inspection program, and x-ray inspection systemOMRON TATEISI ELECTRONICS CO·Filed 2011·Application pending·0 cites
- 1640US2011222647A1X-ray inspection apparatus and x-ray inspection methodOMRON TATEISI ELECTRONICS CO·Filed 2011·Application pending·0 cites
- 1740US2005209822A1Inspection method and system and production method of mounted substrateISHIBA MASATO·Filed 2005·Application pending·0 cites
- 1837US9552803B2Communication method, communication system, and magnetic resonance apparatusGE MEDICAL SYS GLOBAL TECH CO LLC·Filed 2012·Granted Jan 24, 2017·0 cites·18 claims
- 1937US2007165254A1Measuring method and apparatus using color imagesOMRON TATEISI ELECTRONICS CO·Filed 2007·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →