Inventor · disambiguated record
Ki-Won Oh
Also filed as: OH KI WON
1 granted patent·2 pending applications·2 citations·filing 2011–2013
19Inventor score
Top patents by PatentIndex Score
3 records- 0163US8890067B2Inspection system using scanning electron microscopeSAMSUNG DISPLAY CO LTD·Filed 2013·Granted Nov 18, 2014·2 cites·15 claims
- 0242US2014307080A1Crystallized sample inspection apparatusSAMSUNG DISPLAY CO LTD·Filed 2013·Application pending·0 cites
- 0336US2014228230A1Resistance gene to xanthomonas axonopodis in soybeansKIM SUNG YUN·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →