Inventor · disambiguated record

Kinji Okabe

Also filed as: OKABE KINJI

2 granted patents·29 citations·filing 1992–1999

60Inventor score

Technology areasG01R H04N

Files withTOSHIBA KK2

Top patents by PatentIndex Score

2 records

0157US6601203B1Test program generation system and test program generation method for semiconductor test apparatusTOSHIBA KK·Filed 1999·Granted Jul 29, 2003·24 cites·12 claims
0229US5293543AApparatus for color imager defect determinationTOSHIBA KK·Filed 1992·Granted Mar 8, 1994·5 cites·7 claims

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →