Inventor · disambiguated record
Ki-Seon Park
Also filed as: PARK KI-SEON
52 granted patents·17 pending applications·389 citations·filing 1999–2019
98Inventor score
Top patents by PatentIndex Score
69 records- 0198US9865806B2Electronic device and method for fabricating the sameSK HYNIX INC·Filed 2016·Granted Jan 9, 2018·52 cites·20 claims
- 0297US7074668B1Capacitor of semiconductor device and method for forming the sameHYNIX SEMICONDUCTOR INC·Filed 2005·Granted Jul 11, 2006·144 cites·15 claims
- 0393US9991313B2Magnetic memory and manufacturing method of the sameTOSHIBA MEMORY CORP·Filed 2015·Granted Jun 5, 2018·10 cites·16 claims
- 0493US7835134B2Capacitor and method for fabricating the sameHYNIX SEMICONDUCTOR INC·Filed 2009·Granted Nov 16, 2010·19 cites·12 claims
- 0587US9590171B2Electronic device and method for fabricating the sameSK HYNIX INC·Filed 2014·Granted Mar 7, 2017·8 cites·22 claims
- 0687US7616426B2Capacitor and method for fabricating the sameHYNIX SEMICONDUCTOR INC·Filed 2006·Granted Nov 10, 2009·10 cites·32 claims
- 0786US10777742B2Electronic device and method for fabricating the sameSK HYNIX INC·Filed 2019·Granted Sep 15, 2020·2 cites·16 claims
- 0886US7955960B2Nonvolatile memory device and method of fabricating the sameHYNIX SEMICONDUCTOR INC·Filed 2008·Granted Jun 7, 2011·12 cites·22 claims
- 0985US9734060B2Electronic device and method for fabricating the sameSK HYNIX INC·Filed 2015·Granted Aug 15, 2017·4 cites·18 claims
- 1085US7772132B2Method for forming tetragonal zirconium oxide layer and method for fabricating capacitor having the sameHYNIX SEMICONDUCTOR INC·Filed 2006·Granted Aug 10, 2010·10 cites·28 claims
- 1182US7670903B2Method for fabricating a cylindrical capacitor using amorphous carbon-based layerHYNIX SEMICONDUCTOR INC·Filed 2006·Granted Mar 2, 2010·10 cites·36 claims
- 1280US9722172B2Electronic device and method for fabricating the sameSK HYNIX INC·Filed 2015·Granted Aug 1, 2017·3 cites·20 claims
- 1380US9224785B2Electronic device and method for fabricating the sameSK HYNIX INC·Filed 2014·Granted Dec 29, 2015·5 cites·20 claims
- 1479US7501320B2Semiconductor device with dielectric structure and method for fabricating the sameHYNIX SEMICONDUCTOR INC·Filed 2005·Granted Mar 10, 2009·7 cites·29 claims
- 1578US7361544B2Method for fabricating capacitor in semiconductor deviceHYNIX SEMICONDUCTOR INC·Filed 2006·Granted Apr 22, 2008·7 cites·21 claims
- 1677US6673668B2Method of forming capacitor of a semiconductor memory deviceHYNIX SEMICONDUCTOR INC·Filed 2002·Granted Jan 6, 2004·17 cites·19 claims
- 1776US9910596B2Electronic device and method for fabricating the sameSK HYNIX INC·Filed 2016·Granted Mar 6, 2018·2 cites·17 claims
- 1875US6597029B2Nonvolatile semiconductor memory deviceHYNIX SEMICONDUCTOR INC·Filed 2001·Granted Jul 22, 2003·16 cites·7 claims
- 1974US9502639B2Electronic device for improving characteristic of variable resistance element and method of fabricating the sameSK HYNIX INC·Filed 2014·Granted Nov 22, 2016·2 cites·20 claims
- 2073US7754577B2Method for fabricating capacitorHYNIX SEMICONDUCTOR INC·Filed 2006·Granted Jul 13, 2010·4 cites·8 claims
- 2170US9312474B2Electronic devices having semiconductor memory units having magnetic tunnel junction elementSK HYNIX INC·Filed 2013·Granted Apr 12, 2016·3 cites·17 claims
- 2267US6355516B1Method of manufacturing a capacitor with a bi-layer Ta2O5 capacitor dielectric in a semiconductor device including performing a plasma treatment on the first Ta2O5 layerHYUNDAI ELECTRONICS IND·Filed 2000·Granted Mar 12, 2002·11 cites·17 claims
- 2366US9018720B2Semiconductor device and method for fabricating the sameSK HYNIX INC·Filed 2014·Granted Apr 28, 2015·1 cites·12 claims
- 2465US7981786B2Method of fabricating non-volatile memory device having charge trapping layerHYNIX SEMICONDUCTOR INC·Filed 2007·Granted Jul 19, 2011·3 cites·18 claims
- 2564US9029964B2Semiconductor device and method for fabricating the sameHA GA YOUNG·Filed 2012·Granted May 12, 2015·1 cites·12 claims
- 2662US9508921B2Electronic device and method for fabricating the sameSK HYNIX INC·Filed 2014·Granted Nov 29, 2016·2 cites·20 claims
- 2762US6690052B2Semiconductor device having a capacitor with a multi-layer dielectricHYUNDAI ELECTRONICS IND·Filed 2000·Granted Feb 10, 2004·9 cites·8 claims
- 2861US7629221B2Method for forming capacitor of semiconductor deviceHYNIX SEMICONDUCTOR INC·Filed 2005·Granted Dec 8, 2009·2 cites·19 claims
- 2960US11245070B2Electronic device and method for fabricating the sameSK HYNIX INC·Filed 2019·Granted Feb 8, 2022·0 cites·16 claims
- 3060US10490741B2Electronic device and method for fabricating the sameSK HYNIX INC·Filed 2016·Granted Nov 26, 2019·1 cites·7 claims
- 3158US10305030B2Electronic device and method for fabricating the sameSK HYNIX INC·Filed 2018·Granted May 28, 2019·0 cites·19 claims
- 3256US10120799B2Electronic device and method for fabricating the sameSK HYNIX INC·Filed 2017·Granted Nov 6, 2018·0 cites·19 claims
- 3356US2019079873A1Electronic device having variable resistance elementSK HYNIX INC·Filed 2018·Application pending·0 cites
- 3455US7919371B2Method for fabricating non-volatile memory device with charge trapping layerHYNIX SEMICONDUCTOR INC·Filed 2008·Granted Apr 5, 2011·0 cites·15 claims
- 3554US10333061B2Electronic device and method for fabricating the sameSK HYNIX INC·Filed 2017·Granted Jun 25, 2019·0 cites·17 claims
- 3653US9214467B2Method for fabricating capacitorSK HYNIX INC·Filed 2015·Granted Dec 15, 2015·0 cites·10 claims
- 3752US7786521B2Semiconductor device with dielectric structure and method for fabricating the sameHYNIX SEMICONDUCTOR INC·Filed 2009·Granted Aug 31, 2010·0 cites·4 claims
- 3852US2014269039A1Electronic device and variable resistance elementSK HYNIX INC·Filed 2014·Application pending·0 cites
- 3951US6759293B2Method for manufacturing a capacitor in a semiconductor deviceHYNIX SEMICONDUCTOR INC·Filed 2002·Granted Jul 6, 2004·3 cites·16 claims
- 4049US10333060B2Electronic device and method for fabricating the sameSK HYNIX INC·Filed 2017·Granted Jun 25, 2019·0 cites·23 claims
- 4149US2016043300A1Electronic deviceKIM YANG-KON·Filed 2014·Application pending·0 cites
- 4247US7915120B2Method of fabricating non-volatile memory deviceHYNIX SEMICONDUCTOR INC·Filed 2009·Granted Mar 29, 2011·0 cites·25 claims
- 4347US2009108334A1Charge Trap Device and Method for Fabricating the SameHYNIX SEMICONDUCTOR INC·Filed 2008·Application pending·0 cites
- 4447US2016181510A1Semiconductor device and method for fabricating the sameSK HYNIX INC·Filed 2016·Application pending·0 cites
- 4546US9842881B2Electronic device including metal-insulator-semiconductor structure and method for fabricating the sameSK HYNIX INC·Filed 2016·Granted Dec 12, 2017·0 cites·20 claims
- 4646US8946047B2Method for fabricating capacitorKIM JIN-HYOCK·Filed 2010·Granted Feb 3, 2015·0 cites·10 claims
- 4746US2010099243A1Method for forming diode in phase change random access memory deviceHWANG SUN HWAN·Filed 2009·Application pending·0 cites
- 4845US9614008B2Electronic device and method for fabricating the sameSK HYNIX INC·Filed 2015·Granted Apr 4, 2017·0 cites·16 claims
- 4944US9619392B2Electronic device and method for fabricating the sameSK HYNIX INC·Filed 2015·Granted Apr 11, 2017·0 cites·9 claims
- 5044US7259059B2Method for forming capacitor of semiconductor deviceHYNIX SEMICONDUCTOR INC·Filed 2005·Granted Aug 21, 2007·0 cites·10 claims
Showing the top 50 of 69 patent records by PatentIndex Score.
Join the waitlist — get patent alerts
Get an alert when Ki-Seon Park files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →