Inventor · disambiguated record
Ki Yeop Park
Also filed as: PARK KI YEOP
3 granted patents·2 pending applications·16 citations·filing 1995–2004
63Inventor score
Files withHYUNDAI ELECTRONICS IND4
Top patents by PatentIndex Score
5 records- 0146US5928820AMethod for measuring pattern line width during manufacture of a semiconductor deviceHYUNDAI ELECTRONICS IND·Filed 1995·Granted Jul 27, 1999·12 cites·3 claims
- 0233US2005172256A1Mask set for measuring an overlapping error and method of measuring an overlapping error using the sameHYUNDAI ELECTRONICS IND·Filed 2004·Application pending·0 cites
- 0327US5891749AProcess for forming photoresist pattern in semiconductor deviceHYUNDAI ELECTRONICS IND·Filed 1996·Granted Apr 6, 1999·4 cites·9 claims
- 0422US6730528B1Mask set for measuring an overlapping error and method of measuring an overlapping error using the sameHYUNDAI ELECTRONICS IND·Filed 1997·Granted May 4, 2004·0 cites·6 claims
- 0520US2001044166A1Method for forming microlenses with high light transmittance in image sensorFiled 1999·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →