Inventor · disambiguated record
Kiyoshi Toyama
Also filed as: TOYAMA KIYOSHI
11 granted patents·1 pending application·239 citations·filing 1988–2009
92Inventor score
Top patents by PatentIndex Score
12 records- 0195US4931635AOptical position sensor using Faraday effect element and magnetic scaleTEIJIN SEIKI CO LTD·Filed 1988·Granted Jun 5, 1990·94 cites·3 claims
- 0284US5580639AMethod of manufacturing magnetic patternsTEIJIN SEIKI CO LTD·Filed 1993·Granted Dec 3, 1996·33 cites·1 claims
- 0376US5350618AMagnetic medium comprising a substrate having pits and grooves of specific shapes and depthsTEIJIN SEIKI CO LTD·Filed 1992·Granted Sep 27, 1994·27 cites·8 claims
- 0470US5336586AMagnetic medium and method of manufacturing the sameTEIJIN SEIKI CO LTD·Filed 1993·Granted Aug 9, 1994·14 cites·4 claims
- 0564US5527663AMethod of manufacturing a medium having a magnetic patternTEIJIN SEIKI CO LTD·Filed 1995·Granted Jun 18, 1996·15 cites·1 claims
- 0659US5445707AMethod of manufacturing article having magnetic patternsTEIJIN SEIKO CO LTD·Filed 1994·Granted Aug 29, 1995·14 cites·9 claims
- 0759US4931634AOptical position sensor using Kerr effect and a magnetic scaleTEIJIN SEIKI CO LTD·Filed 1988·Granted Jun 5, 1990·14 cites·3 claims
- 0853US5427675AMethod of manufacturing article having magnetic patternsTEIJIN SEIKI CO LTD·Filed 1993·Granted Jun 27, 1995·10 cites·8 claims
- 0947US2010177290A1Optical characteristic measuring method, optical characteristic adjusting method, exposure apparatus, exposing method, and exposure apparatus manufacturing methodNIKON CORP·Filed 2009·Application pending·0 cites
- 1040US5429911AMethod of manufacturing a medium having a magnetic patternTEIJIN SEIKI CO LTD·Filed 1994·Granted Jul 4, 1995·6 cites·1 claims
- 1139US5434934AMagneto-optically modulating systemTEIJIN SEIKI CO LTD·Filed 1994·Granted Jul 18, 1995·6 cites·34 claims
- 1232US6153321AMethod of using a substrate with magnetic substance of a magnetic scaleTEIJUN SEIKI CO·Filed 1994·Granted Nov 28, 2000·6 cites·1 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →