Inventor · disambiguated record
Koji Ashida
Also filed as: ASHIDA KOJI
15 granted patents·1 pending application·34 citations·filing 1995–2023
88Inventor score
Top patents by PatentIndex Score
16 records- 0187US11359307B2Vapour-phase epitaxial growth method, and method for producing substrate equipped with epitaxial layerKWANSEI GAKUIN EDUCATIONAL FOUND·Filed 2017·Granted Jun 14, 2022·4 cites·12 claims
- 0281US12320030B2Method of using sic containerKWANSEI GAKUIN EDUCATIONAL FOUND·Filed 2023·Granted Jun 3, 2025·0 cites·6 claims
- 0374US12325930B2Manufacturing device for SiC semiconductor substrateKWANSEI GAKUIN EDUCATIONAL FOUND·Filed 2022·Granted Jun 10, 2025·0 cites·11 claims
- 0467US10847342B2Reference sample with inclined support base, method for evaluating scanning electron microscope, and method for evaluating SiC substrateKWANSEI GAKUIN EDUCATIONAL FOUND·Filed 2020·Granted Nov 24, 2020·0 cites·5 claims
- 0566US10508361B2Method for manufacturing semiconductor waferKWANSEI GAKUIN EDUCATIONAL FOUND·Filed 2016·Granted Dec 17, 2019·1 cites·11 claims
- 0662US10388536B2Etching method for SiC substrate and holding containerTOYO TANSO CO·Filed 2015·Granted Aug 20, 2019·1 cites·2 claims
- 0754US10699873B2Reference sample with inclined support base, method for evaluating scanning electron microscope, and method for evaluating SiC substrateKWANSEI GAKUIN EDUCATIONAL FOUND·Filed 2017·Granted Jun 30, 2020·0 cites·11 claims
- 0852US12237377B2SiC semiconductor substrate, and, production method therefor and production device thereforKWANSEI GAKUIN EDUCATIONAL FOUND·Filed 2019·Granted Feb 25, 2025·0 cites·6 claims
- 0950US12131960B2Temperature distribution evaluation method, temperature distribution evaluation device, and soaking range evaluation methodKWANSEI GAKUIN EDUCATIONAL FOUND·Filed 2020·Granted Oct 29, 2024·0 cites·23 claims
- 1050US12020928B2SiC semiconductor substrate, method for manufacturing same, and device for manufacturing sameKWANSEI GAKUIN EDUCATIONAL FOUND·Filed 2019·Granted Jun 25, 2024·0 cites·30 claims
- 1148US10665465B2Surface treatment method for SiC substrateKWANSEI GAKUIN EDUCATIONAL FOUND·Filed 2015·Granted May 26, 2020·0 cites·16 claims
- 1243US5862976ABrazeable aluminum alloy cast material and method of brazing the sameSHOWA ALUMINUM CORP·Filed 1996·Granted Jan 26, 1999·8 cites·8 claims
- 1338US5613550ATank for a heat exchangerNIPPON DENSO CO·Filed 1995·Granted Mar 25, 1997·10 cites·13 claims
- 1437US6170738B1Aluminum brazing alloy for cold brazing and method for brazing low-melting aluminum materialSHOWA ALUMINUM CORP·Filed 1997·Granted Jan 9, 2001·7 cites·4 claims
- 1534US2004040153A1Method for manufacturong heat exchangerFiled 2001·Application pending·0 cites
- 1631US5934546AProcess for brazing die-cast aluminum materialSHOWA ALUMINUM CORP·Filed 1997·Granted Aug 10, 1999·3 cites·17 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →