Inventor · disambiguated record
Konstantin Chirko
Also filed as: CHIRKO KONSTANTIN
9 granted patents·5 pending applications·14 citations·filing 2012–2024
79Inventor score
Top patents by PatentIndex Score
14 records- 0196US10903044B1Filling empty structures with deposition under high-energy SEM for uniform DE layeringAPPLIED MATERIALS ISRAEL LTD·Filed 2020·Granted Jan 26, 2021·8 cites·20 claims
- 0279US11264202B2Generating three dimensional information regarding structural elements of a specimenAPPLIED MATERIALS ISRAEL LTD·Filed 2020·Granted Mar 1, 2022·1 cites·20 claims
- 0374US9632044B1Imaging bottom of high aspect ratio holesAPPLIED MATERIALS ISRAEL LTD·Filed 2016·Granted Apr 25, 2017·2 cites·13 claims
- 0463US8804299B2Electrostatic chuck and a method for supporting a waferEYTAN GUY·Filed 2012·Granted Aug 12, 2014·3 cites·21 claims
- 0562US2025341481A1Non-destructive surface metrology of patterned wafersAPPLIED MATERIALS ISRAEL LTD·Filed 2024·Application pending·0 cites
- 0660US2025095955A1Method and system for calibration of diffraction anglesAPPLIED MATERIALS ISRAEL LTD·Filed 2023·Application pending·0 cites
- 0758US12456600B2Scanning electron microscopy-based tomography of specimensAPPLIED MATERIALS ISRAEL LTD·Filed 2023·Granted Oct 28, 2025·0 cites·20 claims
- 0857US2025391707A1Method and system for 3d reconstruction of wafer structure by diagonal millingAPPLIED MATERIALS ISRAEL LTD·Filed 2024·Application pending·0 cites
- 0955US2024249909A1Filling empty structures by deposition under sem - balancing parameters by gas flow controlAPPLIED MATERIALS ISRAEL LTD·Filed 2023·Application pending·0 cites
- 1054US2025216346A1Determination of layer properties using widening of an electron beamAPPLIED MATERIALS ISRAEL LTD·Filed 2024·Application pending·0 cites
- 1145US9448253B2Determining a state of a high aspect ratio hole using measurement results from an electrostatic measurement deviceAPPLIED MATERIALS ISRAEL LTD·Filed 2015·Granted Sep 20, 2016·0 cites·17 claims
- 1244US11921063B2Lateral recess measurement in a semiconductor specimenAPPLIED MATERIALS ISRAEL LTD·Filed 2021·Granted Mar 5, 2024·0 cites·20 claims
- 1339US11953316B2Geometry based three dimensional reconstruction of a semiconductor specimen by solving an optimization problem, using at least two SEM images acquired at different illumination anglesAPPLIED MATERIALS ISRAEL LTD·Filed 2020·Granted Apr 9, 2024·0 cites·20 claims
- 1432US10714306B2Measuring a height profile of a hole formed in non-conductive regionAPPLIED MATERIALS ISRAEL LTD·Filed 2018·Granted Jul 14, 2020·0 cites·15 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →