Inventor · disambiguated record
Kouichi Hiranaka
Also filed as: HIRANAKA KOUICHI
6 granted patents·4 pending applications·43 citations·filing 2002–2013
77Inventor score
Files withHIRANAKA KOUICHI3MATSUSHITA ELECTRIC INDUSTRIAL CO LTD2PANASONIC CORP2YAMADA OSAMU2HATAKEYAMA TAKESHI1
Top patents by PatentIndex Score
10 records- 0176US7282255B2Flexible printed circuit board and process for producing the sameMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2003·Granted Oct 16, 2007·19 cites·18 claims
- 0276US6847448B2Polarization analyzing apparatus and method for polarization analysisMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2002·Granted Jan 25, 2005·22 cites·8 claims
- 0370US8574361B2Group-III element nitride crystal producing method and group-III element nitride crystalYAMADA OSAMU·Filed 2008·Granted Nov 5, 2013·2 cites·12 claims
- 0465US2014030549A1Group iii element nitride crystal producing method and group-iii element nitride crystalYAMADA OSAMU·Filed 2013·Application pending·0 cites
- 0547US2010213576A1Method for producing group iii nitride crystal substrate, group iii nitride crystal substrate, and semiconductor device using group iii nitride crystal substratePANASONIC CORP·Filed 2008·Application pending·0 cites
- 0646US9281438B2Process for producing group III element nitride crystal and apparatus for producing group III element nitride crystalHATAKEYAMA TAKESHI·Filed 2008·Granted Mar 8, 2016·0 cites·6 claims
- 0741US8508738B2Nitrogen oxide sensing element, nitrogen oxide sensor, nitrogen oxide concentration determination device using same, and method for determining nitrogen oxide concentrationHIRANAKA KOUICHI·Filed 2009·Granted Aug 13, 2013·0 cites·13 claims
- 0837US2009278744A1Phased array antennaPANASONIC CORP·Filed 2006·Application pending·0 cites
- 0932US8828734B2Nitric oxide detection element and process for producing sameHIRANAKA KOUICHI·Filed 2011·Granted Sep 9, 2014·0 cites·20 claims
- 1030US2013125618A1Nitric oxide detection elementHIRANAKA KOUICHI·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →