Inventor · disambiguated record
Kotaro Hori
Also filed as: HORI KOTARO
2 granted patents·67 citations·filing 1999–2001
66Inventor score
Top patents by PatentIndex Score
2 records- 0178US7383156B2Apparatus for inspecting wafer surface, method for inspecting wafer surface, apparatus for judging defective wafer, method for judging defective wafer, and apparatus for processing information on wafer surfaceSUMCO TECHXIV CORP·Filed 2001·Granted Jun 3, 2008·31 cites·20 claims
- 0266US6248973B1Laser marking method for semiconductor waferKOMATSU MFG CO LTD·Filed 1999·Granted Jun 19, 2001·36 cites·8 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →