Inventor · disambiguated record
Ko Ishizuka
Also filed as: ISHIZUKA KO
29 granted patents·6 pending applications·443 citations·filing 1991–2015
96Inventor score
Top patents by PatentIndex Score
35 records- 0197US5666196AOptical detection apparatus for detecting information relating to relative displacement of an object on whch a diffraction grating is formedCANON KK·Filed 1995·Granted Sep 9, 1997·174 cites·19 claims
- 0289US8759747B2Absolute rotary encoderISHIZUKA KO·Filed 2011·Granted Jun 24, 2014·8 cites·8 claims
- 0388US6618218B1Displacement detecting apparatus and information recording apparatusCANON KK·Filed 2000·Granted Sep 9, 2003·28 cites·22 claims
- 0485US7061624B2Grating interference type optical encoderCANON KK·Filed 2004·Granted Jun 13, 2006·24 cites·3 claims
- 0583US8860949B2InterferometerISHIZUKA KO·Filed 2011·Granted Oct 14, 2014·5 cites·11 claims
- 0679US8228508B2Origin detection apparatus, displacement measurement apparatus and optical apparatusISHIZUKA KO·Filed 2010·Granted Jul 24, 2012·4 cites·12 claims
- 0779US5448358AOptical apparatus and displacement-information measuring apparatus using the sameCANON KK·Filed 1994·Granted Sep 5, 1995·34 cites·20 claims
- 0878US8742322B2Encoder and interferometer that generate M-phase signals by multiplying N-phase signals by M coefficient sets, where N is not less than 6 and M is not smaller than 2ISHIZUKA KO·Filed 2011·Granted Jun 3, 2014·4 cites·17 claims
- 0978US6674066B1EncoderCANON KK·Filed 2000·Granted Jan 6, 2004·20 cites·55 claims
- 1077US5481106AEncoder with an optical scale and interference of zero and first order diffraction beamsCANON KK·Filed 1993·Granted Jan 2, 1996·32 cites·6 claims
- 1174US7391521B2Position detection apparatus and methodCANON KK·Filed 2005·Granted Jun 24, 2008·8 cites·11 claims
- 1271US6958469B2Diffraction grating interference system encoder for detecting displacement informationCANON KK·Filed 2003·Granted Oct 25, 2005·13 cites·5 claims
- 1370US6473184B1Interferometer which divides light beams into a plurality of beams with different optical pathsCANON KK·Filed 2000·Granted Oct 29, 2002·15 cites·16 claims
- 1469US6657181B1Optical element used in compact interference measuring apparatus detecting plurality of phase difference signalsCANON KK·Filed 2000·Granted Dec 2, 2003·11 cites·1 claims
- 1569US6493170B1Interference device and position detection device using the sameCANON KK·Filed 1999·Granted Dec 10, 2002·20 cites·12 claims
- 1663US7554671B2Absolute position measurement apparatusCANON KK·Filed 2006·Granted Jun 30, 2009·4 cites·9 claims
- 1762US8785838B2Absolute rotary encoderISHIZUKA KO·Filed 2011·Granted Jul 22, 2014·1 cites·10 claims
- 1861US8243279B2Displacement measurement apparatusISHIZUKA KO·Filed 2009·Granted Aug 14, 2012·3 cites·1 claims
- 1961US6570660B2Measuring instrumentCANON KK·Filed 2001·Granted May 27, 2003·9 cites·6 claims
- 2060US7551290B2Absolute position measurement apparatusCANON KK·Filed 2006·Granted Jun 23, 2009·3 cites·9 claims
- 2159US7375820B2Interference measuring apparatus for detecting a plurality of stable phase difference signalsCANON KK·Filed 2006·Granted May 20, 2008·2 cites·4 claims
- 2259US7259863B2Grating interference type optical encoderCANON KK·Filed 2006·Granted Aug 21, 2007·2 cites·4 claims
- 2358US5198873AEncoder utilizing interference using multi-mode semiconductor laserCANON KK·Filed 1991·Granted Mar 30, 1993·16 cites·17 claims
- 2450US9810555B2Absolute encoder that provides increased accuracy against defect in scale thereofCANON KK·Filed 2015·Granted Nov 7, 2017·0 cites·10 claims
- 2550US7054095B2Displacement detection apparatus, and magnetic recording apparatus and encoder using the displacement detection apparatusCANON KK·Filed 2001·Granted May 30, 2006·1 cites·26 claims
- 2646US8416387B2Wavelength shift measuring apparatus, optical source apparatus, interference measuring apparatus, exposure apparatus, and device manufacturing methodISHIZUKA KO·Filed 2009·Granted Apr 9, 2013·0 cites·11 claims
- 2746US7034947B2Compact interference measuring apparatus for detecting the magnitude and direction of positional deviationCANON KK·Filed 2003·Granted Apr 25, 2006·2 cites·3 claims
- 2844US9040900B2Two-dimensional absolute encoder and scale thereforISHIZUKA KO·Filed 2012·Granted May 26, 2015·0 cites·24 claims
- 2943US9267820B2Two-dimensional absolute encoder and scale with marks each having one of a plurality of different characteristic valuesCANON KK·Filed 2013·Granted Feb 23, 2016·0 cites·11 claims
- 3042US2013026351A1Scale and manufacturing method thereof, and absolute encoderCANON KK·Filed 2012·Application pending·0 cites
- 3141US2011096334A1Heterodyne interferometerCANON KK·Filed 2010·Application pending·0 cites
- 3240US2011249270A1Heterodyne interferometry displacement measurement apparatusCANON KK·Filed 2011·Application pending·0 cites
- 3340US2011222073A1Optical encoder and displacement measurement apparatus having the sameCANON KK·Filed 2011·Application pending·0 cites
- 3440US2012032068A1Absolute encoderISHIZUKA KO·Filed 2011·Application pending·0 cites
- 3534US2006140538A1Surface reflection type phase gratingISANO TAISUKE·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →