Inventor · disambiguated record
Koichi Iwao
Also filed as: IWAO KOICHI
2 granted patents·1 pending application·0 citations·filing 2018–2024
23Inventor score
Files withCANON KK3
Top patents by PatentIndex Score
3 records- 0158US11774493B2Semiconductor integrated circuit, method of testing the semiconductor integrated circuit, and semiconductor substrateCANON KK·Filed 2022·Granted Oct 3, 2023·0 cites·18 claims
- 0243US10650905B2Inspection apparatus, image sensing apparatus, electronic equipment, and transportation equipmentCANON KK·Filed 2018·Granted May 12, 2020·0 cites·14 claims
- 0339US2025226048A1Semiconductor device and apparatusCANON KK·Filed 2024·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →