Inventor · disambiguated record
Koichiro Komatsu
Also filed as: KOMATSU KOICHIRO
19 granted patents·2 pending applications·545 citations·filing 1989–2025
95Inventor score
Top patents by PatentIndex Score
21 records- 0195US7311378B2Wiping apparatus and imaging apparatus provided therewith, method of manufacturing electro-optical device, electro-optical device, and electronic apparatusSEIKO EPSON CORP·Filed 2005·Granted Dec 25, 2007·28 cites·6 claims
- 0295US5028934AHand-held portable printing systemSEIKO EPSON CORP·Filed 1989·Granted Jul 2, 1991·117 cites·29 claims
- 0390US7298471B2Surface inspection apparatus and surface inspection methodNIKON CORP·Filed 2006·Granted Nov 20, 2007·12 cites·14 claims
- 0488US5070250APosition detection apparatus with adjustable beam and interference fringe positionsNIKON CORP·Filed 1991·Granted Dec 3, 1991·61 cites·2 claims
- 0586US5859707APosition detection apparatus and aligner comprising sameNIKON CORP·Filed 1997·Granted Jan 12, 1999·64 cites·36 claims
- 0683US8049901B2Measuring device and measuring methodNIKON CORP·Filed 2009·Granted Nov 1, 2011·12 cites·15 claims
- 0782US5171999AAdjustable beam and interference fringe positionNIKON CORP·Filed 1991·Granted Dec 15, 1992·40 cites·9 claims
- 0880US6563577B2Defect testing apparatus and defect testing methodNIKON CORP·Filed 2001·Granted May 13, 2003·19 cites·14 claims
- 0979US6774987B2Surface inspection method, surface inspection apparatus, and recording medium and data signal for providing surface inspection programNIKON CORP·Filed 2003·Granted Aug 10, 2004·23 cites·16 claims
- 1079US6512578B1Method and apparatus for surface inspectionNIKON CORP·Filed 1998·Granted Jan 28, 2003·57 cites·26 claims
- 1173US6313913B1Surface inspection apparatus and methodNIKON CORP·Filed 1999·Granted Nov 6, 2001·39 cites·11 claims
- 1272US7322335B2Oil pan structureTOYOTA MOTOR CO LTD·Filed 2005·Granted Jan 29, 2008·6 cites·8 claims
- 1371US7324274B2Microscope and immersion objective lensNIKON CORP·Filed 2004·Granted Jan 29, 2008·14 cites·20 claims
- 1469US8687182B2Surface inspection apparatus and surface inspection methodNIKON CORP·Filed 2012·Granted Apr 1, 2014·1 cites·17 claims
- 1568US2025321497A1Illumination optical system, exposure apparatus, and device manufacturing methodNIKON CORP·Filed 2025·Application pending·0 cites
- 1663US6097483AImage detection apparatusNIKON CORP·Filed 1999·Granted Aug 1, 2000·26 cites·17 claims
- 1762US5907396AOptical detection system for detecting defects and/or particles on a substrateNIKON CORP·Filed 1997·Granted May 25, 1999·25 cites·15 claims
- 1857US8403687B2Data storage device and printing apparatus including the sameABE TSUKASA·Filed 2010·Granted Mar 26, 2013·1 cites·4 claims
- 1956US7834993B2Surface inspection apparatus and surface inspection methodNIKON CORP·Filed 2007·Granted Nov 16, 2010·0 cites·29 claims
- 2051US8441627B2Surface inspection apparatus and surface inspection methodFUKAZAWA KAZUHIKO·Filed 2010·Granted May 14, 2013·0 cites·14 claims
- 2144US2003112428A1Method and apparatus for surface inspectionNIKON CORP·Filed 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →