Inventor · disambiguated record
Kook Nyung Lee
Also filed as: LEE KOOK NYUNG
10 granted patents·5 citations·filing 2006–2022
77Inventor score
Top patents by PatentIndex Score
10 records- 0165US8080481B2Method of manufacturing a nanowire deviceLEE KOOK-NYUNG·Filed 2006·Granted Dec 20, 2011·5 cites·10 claims
- 0262US12314506B2Pressure sensor module comprising at least one sensing electrode facing conductive resistor and apparatus and method for controlling the pressure sensor moduleKOREA ELECTRONICS TECHNOLOGY·Filed 2022·Granted May 27, 2025·0 cites·10 claims
- 0358US11921080B2Gas sensor array having shared field effect transistorKOREA ELECTRONICS TECHNOLOGY·Filed 2020·Granted Mar 5, 2024·0 cites·10 claims
- 0456US12152948B2Pressure sensor comprising sensing thread passing through a through-holeKOREA ELECTRONICS TECHNOLOGY·Filed 2022·Granted Nov 26, 2024·0 cites·19 claims
- 0555US12140558B2Biosensor using FET element and extended gate, and operating method thereofKOREA ELECTRONICS TECHNOLOGY·Filed 2020·Granted Nov 12, 2024·0 cites·3 claims
- 0654US12276555B2Conductive yarn pressure sensor with sensing electrodes physically or electrically contacting each other through openings in intermediate layer in reponse to external pressureKOREA ELECTRONICS TECHNOLOGY·Filed 2022·Granted Apr 15, 2025·0 cites·11 claims
- 0748US12007293B2Pressure sensor using conductive thread and method of manufacturing the sameKOREA ELECTRONICS TECHNOLOGY·Filed 2021·Granted Jun 11, 2024·0 cites·11 claims
- 0843US12427515B2Integrated molecular diagnosis apparatusWIZBIOSOLUTIONS INC·Filed 2022·Granted Sep 30, 2025·0 cites·22 claims
- 0936US10063800B2Image sensor using nanowire and method of manufacturing the sameKOREA ELECTRONICS TECHNOLOGY·Filed 2016·Granted Aug 28, 2018·0 cites·10 claims
- 1035US9960299B2Avalanche photodiode using silicon nanowire and silicon nanowire photomultiplier using the sameKOREA ELECTRONICS TECHNOLOGY·Filed 2016·Granted May 1, 2018·0 cites·5 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →