Inventor · disambiguated record

Kort Longenbach

Also filed as: LONGENBACH KORT F

1 granted patent·1 pending application·210 citations·filing 1990–2006

56Inventor score

Technology areasG01R G06F

Files withAPPENZELLER DAVID P1 IBM1

Top patents by PatentIndex Score

2 records

0192US5001423ADry interface thermal chuck temperature control system for semiconductor wafer testingIBM·Filed 1990·Granted Mar 19, 1991·210 cites·23 claims
0233US2007162446A1Method of testing a multi-processor unit microprocessorAPPENZELLER DAVID P·Filed 2006·Application pending·0 cites

Join the waitlist — get patent alerts

Get an alert when Kort Longenbach files or is granted a new patent.

We store only your email — no account needed. See our privacy policy.

Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →