Inventor · disambiguated record
Koichi Nagoya
Also filed as: NAGOYA KOICHI
8 granted patents·28 citations·filing 2007–2014
83Inventor score
Files withHITACHI HIGH TECH CORP4HITACHI HIGH TECHNOLOGIES CORO1NAGOYA KOICHI1OTANI SEIJI1YAMASHITA HIROYUKI1
Top patents by PatentIndex Score
8 records- 0188US8422009B2Foreign matter inspection method and foreign matter inspection apparatusYAMASHITA HIROYUKI·Filed 2011·Granted Apr 16, 2013·6 cites·5 claims
- 0282US7557913B2Optical apparatus for defect inspectionHITACHI HIGH TECHNOLOGIES CORO·Filed 2007·Granted Jul 7, 2009·11 cites·5 claims
- 0379US7787115B2Optical apparatus for defect inspectionHITACHI HIGH TECH CORP·Filed 2009·Granted Aug 31, 2010·5 cites·7 claims
- 0474US7719671B2Foreign matter inspection method and foreign matter inspection apparatusHITACHI HIGH TECH CORP·Filed 2007·Granted May 18, 2010·3 cites·6 claims
- 0560US8417769B2Gateway having distributed processing function, and communication terminalNAGOYA KOICHI·Filed 2009·Granted Apr 9, 2013·3 cites·4 claims
- 0656US9964500B2Defect inspection device, display device, and defect classification deviceHITACHI HIGH TECH CORP·Filed 2014·Granted May 8, 2018·0 cites·16 claims
- 0755US7986405B2Foreign matter inspection method and foreign matter inspection apparatusHITACHI HIGH TECH CORP·Filed 2010·Granted Jul 26, 2011·0 cites·8 claims
- 0847US8154717B2Optical apparatus for defect inspectionOTANI SEIJI·Filed 2010·Granted Apr 10, 2012·0 cites·5 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →