Inventor · disambiguated record
Koichiro Noguchi
Also filed as: NOGUCHI KOICHIRO
17 granted patents·5 pending applications·21 citations·filing 2008–2020
89Inventor score
Files withRENESAS ELECTRONICS CORP8MITSUBISHI ELECTRIC CORP5KAMEDA YOSHIO3NOGUCHI KOICHIRO3NAKAGAWA YOSHIHIRO2
Top patents by PatentIndex Score
22 records- 0183US9843227B2Power supply device, and control method of power supply deviceRENESAS ELECTRONICS CORP·Filed 2015·Granted Dec 12, 2017·4 cites·20 claims
- 0279US10033372B2Semiconductor deviceRENESAS ELECTRONICS CORP·Filed 2015·Granted Jul 24, 2018·3 cites·16 claims
- 0377US10305468B2Semiconductor deviceRENESAS ELECTRONICS CORP·Filed 2018·Granted May 28, 2019·2 cites·9 claims
- 0475US9965418B2Semiconductor device, semiconductor system including the same, control method of semiconductor device, and check list generation programRENESAS ELECTRONICS CORP·Filed 2016·Granted May 8, 2018·2 cites·19 claims
- 0575US8653861B2Control voltage generating circuit, constant current source circuit, and delay circuit and logic circuit including the sameNOGUCHI KOICHIRO·Filed 2011·Granted Feb 18, 2014·5 cites·19 claims
- 0664US10630279B2Power semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 2019·Granted Apr 21, 2020·1 cites·10 claims
- 0764US8399960B2Semiconductor deviceNAKAGAWA YOSHIHIRO·Filed 2009·Granted Mar 19, 2013·3 cites·4 claims
- 0857US10812062B2Driving device for semiconductor elementMITSUBISHI ELECTRIC CORP·Filed 2019·Granted Oct 20, 2020·0 cites·12 claims
- 0956US10230275B2Power supply device, and control method of power supply deviceRENESAS ELECTRONICS CORP·Filed 2017·Granted Mar 12, 2019·0 cites·17 claims
- 1049US8513970B2Semiconductor device and method of testing the sameKAMEDA YOSHIO·Filed 2009·Granted Aug 20, 2013·1 cites·18 claims
- 1147US9906079B2Power supply circuitRENESAS ELECTRONICS CORP·Filed 2014·Granted Feb 27, 2018·0 cites·17 claims
- 1246US2017300329A1Instruction execution control system and instruction execution control methodRENESAS ELECTRONICS CORP·Filed 2014·Application pending·0 cites
- 1346US2011006443A1Semiconductor deviceNEC CORP·Filed 2009·Application pending·0 cites
- 1445US10998902B2Semiconductor module and semiconductor packageMITSUBISHI ELECTRIC CORP·Filed 2020·Granted May 4, 2021·0 cites·6 claims
- 1541US8536890B2Semiconductor inspecting device and semiconductor inspecting methodKAMEDA YOSHIO·Filed 2009·Granted Sep 17, 2013·0 cites·21 claims
- 1640US11069602B2Package and terminal arrangement for semiconductor moduleMITSUBISHI ELECTRIC CORP·Filed 2016·Granted Jul 20, 2021·0 cites·10 claims
- 1740US10333514B2Power moduleMITSUBISHI ELECTRIC CORP·Filed 2018·Granted Jun 25, 2019·0 cites·18 claims
- 1840US8570056B2Semiconductor inspection apparatus, semiconductor wafer positioning method, and semiconductor wafer inspection methodKAMEDA YOSHIO·Filed 2009·Granted Oct 29, 2013·0 cites·16 claims
- 1937US8441277B2Semiconductor testing device, semiconductor device, and testing methodNOGUCHI KOICHIRO·Filed 2008·Granted May 14, 2013·0 cites·14 claims
- 2036US2012018726A1Semiconductor wafer and method for manufacturing semiconductor deviceNAKAGAWA YOSHIHIRO·Filed 2010·Application pending·0 cites
- 2136US2016132040A1Connection relation detecting system, information processing apparatus, and connection relation detecting methodRENESAS ELECTRONICS CORP·Filed 2015·Application pending·0 cites
- 2234US2012025790A1Electronic circuit, circuit apparatus, test system, control method of the electronic circuitNOGUCHI KOICHIRO·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →