Inventor · disambiguated record
Kouetsu Sawai
Also filed as: SAWAI KOUETSU
2 granted patents·1 pending application·11 citations·filing 1999–2002
54Inventor score
Files withMITSUBISHI ELECTRIC CORP3
Top patents by PatentIndex Score
3 records- 0159US6636824B1Method of and apparatus for inspecting semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Oct 21, 2003·9 cites·13 claims
- 0233US2003012422A1Method of recognizing pattern side face and method of detecting and classifying defectsMITSUBISHI ELECTRIC CORP·Filed 2002·Application pending·0 cites
- 0325US6060781ASemiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 1999·Granted May 9, 2000·2 cites·8 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →