Inventor · disambiguated record
Kok Weng Wong
Also filed as: WONG KOK WENG
5 granted patents·1 pending application·6 citations·filing 2010–2019
68Inventor score
Files withAMANULLAH AJHARALI2MIT SEMICONDUCTOR PTE LTD2Generic Power Ptd Ltd1SEMICONDUCTOR TECH & INSTRUMENTS PTE LTD1
Top patents by PatentIndex Score
6 records- 0184US10876975B2System and method for inspecting a waferSEMICONDUCTOR TECH & INSTRUMENTS PTE LTD·Filed 2018·Granted Dec 29, 2020·4 cites·14 claims
- 0259US10161881B2System and method for inspecting a waferAMANULLAH AJHARALI·Filed 2010·Granted Dec 25, 2018·1 cites·28 claims
- 0349US10151580B2Methods of inspecting a 3D object using 2D image processingGeneric Power Ptd Ltd·Filed 2015·Granted Dec 11, 2018·1 cites·7 claims
- 0449US2015233840A1System and method for inspecting a waferAMANULLAH AJHARALI·Filed 2013·Application pending·0 cites
- 0538US11825211B2Method of color inspection by using monochrome imaging with multiple wavelengths of lightMIT SEMICONDUCTOR PTE LTD·Filed 2019·Granted Nov 21, 2023·0 cites·7 claims
- 0626US11953312B2System and method of object inspection using multispectral 3D laser scanningMIT SEMICONDUCTOR PTE LTD·Filed 2019·Granted Apr 9, 2024·0 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →