Inventor · disambiguated record
Koh Yoshikawa
Also filed as: YOSHIKAWA KOH
42 granted patents·12 pending applications·172 citations·filing 2000–2025
97Inventor score
Files withFUJI ELECTRIC CO LTD28YOSHIKAWA KOH14FUJI ELECTRIC SYSTEMS CO LTD4FUJI ELECTRIC HOLDINGS3DENSO CORP1
Top patents by PatentIndex Score
54 records- 0191US7977704B2Semiconductor device having insulated gate semiconductor element, and insulated gate bipolar transistorDENSO CORP·Filed 2009·Granted Jul 12, 2011·19 cites·7 claims
- 0290US8097901B2Semiconductor device having insulated gate semiconductor element, and insulated gate bipolar transistorKOYAMA MASAKI·Filed 2011·Granted Jan 17, 2012·11 cites·4 claims
- 0387US6380586B1Trench-type insulated gate bipolar transistorFUJI ELECTRIC CO LTD·Filed 2000·Granted Apr 30, 2002·46 cites·21 claims
- 0485US8278682B2Semiconductor deviceYOSHIKAWA KOH·Filed 2011·Granted Oct 2, 2012·9 cites·20 claims
- 0583US9466711B2Semiconductor deviceMOMOTA SEIJI·Filed 2009·Granted Oct 11, 2016·9 cites·18 claims
- 0681US8618557B2Wide-band-gap reverse-blocking MOS-type semiconductor deviceYOSHIKAWA KOH·Filed 2012·Granted Dec 31, 2013·6 cites·12 claims
- 0781US7535059B2Semiconductor device and manufacturing method of the semiconductor deviceFUJI ELECTRIC HOLDINGS·Filed 2006·Granted May 19, 2009·8 cites·14 claims
- 0879US8861240B2Power converterFUJI ELECTRIC CO LTD·Filed 2014·Granted Oct 14, 2014·5 cites·18 claims
- 0978US12009268B2Semiconductor device and fabrication method for semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2023·Granted Jun 11, 2024·0 cites·20 claims
- 1076US11742249B2Semiconductor device and fabrication method for semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2022·Granted Aug 29, 2023·0 cites·7 claims
- 1176US9825145B2Method of manufacturing silicon carbide semiconductor device including forming an electric field control region by a laser doping technologyFUJI ELECTRIC CO LTD·Filed 2016·Granted Nov 21, 2017·2 cites·15 claims
- 1276US9659775B2Method for doping impurities, method for manufacturing semiconductor deviceUNIV KYUSHU NAT UNIV CORP·Filed 2016·Granted May 23, 2017·2 cites·24 claims
- 1375US7943439B2Method for manufacturing semiconductor apparatusFUJI ELECTRIC SYSTEMS CO LTD·Filed 2009·Granted May 17, 2011·6 cites·15 claims
- 1473US7098488B2Insulated gate bipolar transistorFUJI ELECTRIC HOLDINGS·Filed 2004·Granted Aug 29, 2006·19 cites·21 claims
- 1572US8258032B2Power semiconductor devices and methods for manufacturing the sameYOSHIKAWA KOH·Filed 2009·Granted Sep 4, 2012·4 cites·13 claims
- 1671US7737490B2Vertical and trench type insulated gate MOS semiconductor deviceFUJI ELECTRIC SYSTEMS CO LTD·Filed 2007·Granted Jun 15, 2010·4 cites·17 claims
- 1768US8334565B2Trench type insulated gate MOS semiconductor deviceYOSHIKAWA KOH·Filed 2008·Granted Dec 18, 2012·4 cites·22 claims
- 1868US7943991B2Semiconductor deviceFUJI ELECTRIC SYSTEMS CO LTD·Filed 2006·Granted May 17, 2011·3 cites·9 claims
- 1967US8604584B2Semiconductor device and method of manufacturing semiconductor deviceWAKIMOTO HIROKI·Filed 2011·Granted Dec 10, 2013·2 cites·6 claims
- 2067US2025185266A1Semiconductor device and manufacturing methodFUJI ELECTRIC CO LTD·Filed 2025·Application pending·0 cites
- 2166US11749675B2Semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2021·Granted Sep 5, 2023·0 cites·5 claims
- 2266US11450734B2Semiconductor device and fabrication method for semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2020·Granted Sep 20, 2022·0 cites·34 claims
- 2366US2025380440A1Insulated gate semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2025·Application pending·0 cites
- 2464US12218228B2Semiconductor device and manufacturing methodFUJI ELECTRIC CO LTD·Filed 2021·Granted Feb 4, 2025·0 cites·12 claims
- 2563US8558342B2Semiconductor deviceYOSHIKAWA KOH·Filed 2010·Granted Oct 15, 2013·2 cites·7 claims
- 2663US8334581B2Semiconductor device exhibiting withstand voltages in the forward and reverse directionsYOSHIKAWA KOH·Filed 2010·Granted Dec 18, 2012·2 cites·7 claims
- 2763US2025351552A1Semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2025·Application pending·0 cites
- 2862US8138542B2Semiconductor device and manufacturing method of the semiconductor deviceYOSHIKAWA KOH·Filed 2009·Granted Mar 20, 2012·2 cites·4 claims
- 2960US9184268B2Semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2014·Granted Nov 10, 2015·1 cites·8 claims
- 3060US8089094B2Semiconductor deviceYOSHIKAWA KOH·Filed 2009·Granted Jan 3, 2012·2 cites·6 claims
- 3160US7772677B2Semiconductor device and method of forming the same having a junction termination structure with a beveled sidewallFUJI ELECTRIC SYSTEMS CO LTD·Filed 2007·Granted Aug 10, 2010·2 cites·15 claims
- 3260US2025040161A1Semiconductor device, semiconductor module, and manufacturing methodFUJI ELECTRIC CO LTD·Filed 2024·Application pending·0 cites
- 3360US2024395914A1Semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2024·Application pending·0 cites
- 3459US2024304668A1Semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2024·Application pending·0 cites
- 3559US2024234555A1Semiconductor device and manufacturing methodFUJI ELECTRIC CO LTD·Filed 2024·Application pending·0 cites
- 3658US8809911B2Semiconductor deviceYOSHIKAWA KOH·Filed 2011·Granted Aug 19, 2014·1 cites·11 claims
- 3758US2024088214A1Semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2023·Application pending·0 cites
- 3857US12495596B2Semiconductor device and manufacturing methodFUJI ELECTRIC CO LTD·Filed 2022·Granted Dec 9, 2025·0 cites·29 claims
- 3957US8089134B2Semiconductor deviceYOSHIKAWA KOH·Filed 2009·Granted Jan 3, 2012·1 cites·20 claims
- 4056US2025254983A1Semiconductor device and method for manufacturing semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2025·Application pending·0 cites
- 4155US10916541B2Semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2016·Granted Feb 9, 2021·0 cites·6 claims
- 4254US10109501B2Manufacturing method of semiconductor device having a voltage resistant structureFUJI ELECTRIC CO LTD·Filed 2017·Granted Oct 23, 2018·0 cites·3 claims
- 4354US9786749B2Semiconductor device having a voltage resistant structureFUJI ELECTRIC CO LTD·Filed 2016·Granted Oct 10, 2017·0 cites·9 claims
- 4454US9355858B2Method of manufacturing semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2013·Granted May 31, 2016·0 cites·15 claims
- 4554US2023282737A1Semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2023·Application pending·0 cites
- 4648US8742501B2Power semiconductor devices and methods for manufacturing the sameYOSHIKAWA KOH·Filed 2012·Granted Jun 3, 2014·0 cites·6 claims
- 4747US8125027B2Semiconductor device having trenches extending through channel regionsYOSHIKAWA KOH·Filed 2011·Granted Feb 28, 2012·0 cites·4 claims
- 4846US11245010B2Semiconductor device and method of manufacturing semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2020·Granted Feb 8, 2022·0 cites·8 claims
- 4943US8242556B2Vertical and trench type insulated gate MOS semiconductor deviceYOSHIKAWA KOH·Filed 2010·Granted Aug 14, 2012·0 cites·2 claims
- 5042US2014361312A1Semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2014·Application pending·0 cites
Showing the top 50 of 54 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →