Inventor · disambiguated record
Kristofor J. Dickson
Also filed as: DICKSON KRISTOFOR J · DICKSON KRISTOFOR JASON
2 granted patents·2 pending applications·23 citations·filing 2007–2022
58Inventor score
Top patents by PatentIndex Score
4 records- 0184US10352995B1System and method of multiplexing laser triggers and optically selecting multiplexed laser pulses for laser assisted device alteration testing of semiconductor deviceNXP USA INC·Filed 2018·Granted Jul 16, 2019·4 cites·20 claims
- 0284US7872489B2Radiation induced fault analysisFREESCALE SEMICONDUCTOR INC·Filed 2008·Granted Jan 18, 2011·19 cites·20 claims
- 0351US2024047281A1Structure and method for test-point access in a semiconductorNXP USA INC·Filed 2022·Application pending·0 cites
- 0432US2009147255A1Method for testing a semiconductor device and a semiconductor device testing systemERINGTON KENT B·Filed 2007·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →