Inventor · disambiguated record
Kris Iniewski
Also filed as: INIEWSKI KRIS
10 granted patents·196 citations·filing 1996–2016
91Inventor score
Top patents by PatentIndex Score
10 records- 0192US10393891B2Sub-pixel segmentation for semiconductor radiation detectors and methods of fabricating thereofREDLEN TECH INC·Filed 2016·Granted Aug 27, 2019·8 cites·12 claims
- 0287US10396109B2Local storage device in high flux semiconductor radiation detectors and methods of operating thereofREDLEN TECH·Filed 2016·Granted Aug 27, 2019·12 cites·16 claims
- 0378US6075419AHigh speed wide tuning range multi-phase output ring oscillatorPMC SIERRA LTD·Filed 1999·Granted Jun 13, 2000·30 cites·20 claims
- 0477US5910874AGate-coupled structure for enhanced ESD input/output pad protection in CMOS ICsPMC SIERRA LTD·Filed 1997·Granted Jun 8, 1999·56 cites·7 claims
- 0566US6104277APolysilicon defined diffused resistorPMC SIERRA LTD·Filed 1997·Granted Aug 15, 2000·27 cites·18 claims
- 0661US5973977APoly fuses in CMOS integrated circuitsPMC SIERRA LTD·Filed 1998·Granted Oct 26, 1999·21 cites·10 claims
- 0757US5734541ALow voltage silicon controlled rectifier structure for ESD input pad protection in CMOS IC'sPMC SIERRA INC·Filed 1996·Granted Mar 31, 1998·20 cites·3 claims
- 0845US5760618AProcess compensated integrated circuit output driverPMC SIERRA INC·Filed 1996·Granted Jun 2, 1998·11 cites·15 claims
- 0937US6128171AGate-coupled structure for enhanced ESD input/output pad protection in CMOS ICsPMC SIERRA LTD·Filed 1999·Granted Oct 3, 2000·7 cites·16 claims
- 1027US6185713B1Method and apparatus for improving stuck-at fault detection in large scale integrated circuit testingPMC SIERRA LTD·Filed 1998·Granted Feb 6, 2001·4 cites·4 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →