Inventor · disambiguated record
Kristof Paredis
Also filed as: PAREDIS KRISTOF
6 granted patents·1 pending application·2 citations·filing 2013–2020
66Inventor score
Top patents by PatentIndex Score
7 records- 0172US10746759B2Method for determining the shape of a sample tip for atom probe tomographyIMEC VZW·Filed 2019·Granted Aug 18, 2020·2 cites·20 claims
- 0251US11112427B2Method and tip substrate for scanning probe microscopyIMEC VZW·Filed 2020·Granted Sep 7, 2021·0 cites·13 claims
- 0350US10541108B2Method and apparatus for transmission electron microscopyIMEC VZW·Filed 2018·Granted Jan 21, 2020·0 cites·16 claims
- 0444US11125805B2Device for measuring surface characteristics of a materialIMEC VZW·Filed 2019·Granted Sep 21, 2021·0 cites·15 claims
- 0539US2015226766A1Apparatus and method for atomic force microscopyBRUKER NANO INC·Filed 2013·Application pending·0 cites
- 0636US11549963B2Method and apparatus for aligning a probe for scanning probe microscopy to the tip of a pointed sampleIMEC VZW·Filed 2019·Granted Jan 10, 2023·0 cites·18 claims
- 0735US10495666B2Device and method for two dimensional active carrier profiling of semiconductor componentsIMEC VZW·Filed 2018·Granted Dec 3, 2019·0 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →