Inventor · disambiguated record
Krishna N H Sri
Also filed as: SRI KRISHNA N H
10 granted patents·11 pending applications·6 citations·filing 2008–2025
79Inventor score
Top patents by PatentIndex Score
21 records- 0176US11275131B1Test and measurement instrument for determining maximum flux densityTEKTRONIX INC·Filed 2019·Granted Mar 15, 2022·2 cites·20 claims
- 0275US10895612B2Test and measurement instrument with a hysteresis loop maskTEKTRONIX INC·Filed 2018·Granted Jan 19, 2021·2 cites·21 claims
- 0371US12092693B2System and method for computing direct quadrature zero resultant drive vector using rotor positionTEKTRONIX INC·Filed 2022·Granted Sep 17, 2024·0 cites·26 claims
- 0467US12498410B2Flexible wide bandgap double pulse testing methodologyTEKTRONIX INC·Filed 2022·Granted Dec 16, 2025·0 cites·18 claims
- 0567US12345755B2Reverse recovery measurements and plotsTEKTRONIX INC·Filed 2022·Granted Jul 1, 2025·0 cites·16 claims
- 0667US9618965B2Dynamic calibration of data patternsTEKTRONIX INC·Filed 2015·Granted Apr 11, 2017·2 cites·20 claims
- 0762US2025309905A1Method to identify, isolate and remove the source(s) of jitter affecting reference clock and data using time interval errorTEKTRONIX INC·Filed 2025·Application pending·0 cites
- 0859US2025231220A1Acceleration insights, enhancing efficiency, and enabling predictive maintenance in test and measurement systems using artificial intelligence assistantTEKTRONIX INC·Filed 2024·Application pending·0 cites
- 0957US12020855B2Test and measurement instrument for determining magnetic core lossesTEKTRONIX INC·Filed 2021·Granted Jun 25, 2024·0 cites·18 claims
- 1055US2025062720A1Automated testing of a photovoltaic power system and associated components using an oscilloscopeTEKTRONIX INC·Filed 2024·Application pending·0 cites
- 1153US2024353470A1System and methods to accurately measure dynamic resistance for power devicesTEKTRONIX INC·Filed 2024·Application pending·0 cites
- 1250US2024345166A1Defect analysis of electric motors using reference frames (dqz components)TEKTRONIX INC·Filed 2024·Application pending·0 cites
- 1347US2024142530A1System and method to characterize the performance of electrical storage systemsTEKTRONIX INC·Filed 2023·Application pending·0 cites
- 1446US2024036143A1Dynamic vertical signal calibration in a test and measurement instrumentTEKTRONIX INC·Filed 2023·Application pending·0 cites
- 1545US12088223B2DQ0 and inverse DQ0 transformation for three-phase inverter, motor and drive designTEKTRONIX INC·Filed 2020·Granted Sep 10, 2024·0 cites·20 claims
- 1644US2024044968A1Method and apparatus for determining output charge of wide bandgap devices without hardware modificationTEKTRONIX INC·Filed 2023·Application pending·0 cites
- 1744US2023251699A1Method and apparatus for measuring power supply induced jitterTEKTRONIX INC·Filed 2023·Application pending·0 cites
- 1844US2024027513A1Automated de-skew system and method for high voltage semiconductorsTEKTRONIX INC·Filed 2023·Application pending·0 cites
- 1935US2008297170A1Dynamic inductance measurement of electric motorTEKTRONIX INC·Filed 2008·Application pending·0 cites
- 2034US11181581B2Switching loss measurement and plot in test and measurement instrumentTEKTRONIX INC·Filed 2014·Granted Nov 23, 2021·0 cites·15 claims
- 2119US8670947B2Computer system for automatically determining slew rate de-rating valuesPRASANTH G R N·Filed 2010·Granted Mar 11, 2014·0 cites·8 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →