Inventor · disambiguated record
Kuang-Shing Chen
Also filed as: CHEN KUANG-SHING
8 granted patents·3 pending applications·58 citations·filing 2000–2025
79Inventor score
Top patents by PatentIndex Score
11 records- 0191US6425202B1Microbe-mediated method and apparatus for attracting mosquitoesBIOWARE TECHNOLOGY CO LTD·Filed 2000·Granted Jul 30, 2002·58 cites·19 claims
- 0283US2025315942A1Hot spot defect detecting method and hot spot defect detecting systemTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 0379US12387318B2Hot spot defect detecting method and hot spot defect detecting systemTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Granted Aug 12, 2025·0 cites·20 claims
- 0477US12243218B2Method and system for scanning waferTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Mar 4, 2025·0 cites·20 claims
- 0573US2024266232A1Semiconductor structure inspection using a high atomic number materialTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 0668US11783469B2Method and system for scanning waferTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Oct 10, 2023·0 cites·20 claims
- 0767US11900586B2Hot spot defect detecting method and hot spot defect detecting systemTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Feb 13, 2024·0 cites·20 claims
- 0865US11984365B2Semiconductor structure inspection using a high atomic number materialTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted May 14, 2024·0 cites·20 claims
- 0958US2025327859A1Systems and methods for automated analysis of voltage contrast defects in integrated circuit inspectionTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 1057US11037289B2Method and system for scanning waferTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Jun 15, 2021·0 cites·20 claims
- 1154US10872406B2Hot spot defect detecting method and hot spot defect detecting systemTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Dec 22, 2020·0 cites·20 claims
Join the waitlist — get patent alerts
Get an alert when Kuang-Shing Chen files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →