Inventor · disambiguated record
Kuninobu Fujii
Also filed as: FUJII KUNINOBU
1 granted patent·2 pending applications·2 citations·filing 2006–2024
19Inventor score
Top patents by PatentIndex Score
3 records- 0137US7439754B2Semiconductor integrated circuit and device and method for testing the circuitNEC ELETRONICS CORP·Filed 2006·Granted Oct 21, 2008·2 cites·9 claims
- 0235US2025349380A1Semiconductor device, semiconductor device testing apparatus and semiconductor device testing methodRENESAS ELECTRONICS CORP·Filed 2024·Application pending·0 cites
- 0320US2010205493A1Semiconductor integrated circuit, method of testing semiconductor integrated circuit, and method of designing semiconductor integrated circuitNEC ELECTRONICS CORP·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →