Inventor · disambiguated record
Kuen-Chyr Lee
Also filed as: LEE KUEN-CHYR
6 granted patents·3 pending applications·55 citations·filing 2001–2006
81Inventor score
Files withTAIWAN SEMICONDUCTOR MFG9
Top patents by PatentIndex Score
9 records- 0173US6734101B1Solution to the problem of copper hillocksTAIWAN SEMICONDUCTOR MFG·Filed 2001·Granted May 11, 2004·22 cites·29 claims
- 0270US7202142B2Method for producing low defect density strained -Si channel MOSFETSTAIWAN SEMICONDUCTOR MFG·Filed 2004·Granted Apr 10, 2007·13 cites·23 claims
- 0369US6982208B2Method for producing high throughput strained-Si channel MOSFETSTAIWAN SEMICONDUCTOR MFG·Filed 2004·Granted Jan 3, 2006·12 cites·27 claims
- 0458US7012009B2Method for improving the electrical continuity for a silicon-germanium film across a silicon/oxide/polysilicon surface using a novel two-temperature processTAIWAN SEMICONDUCTOR MFG·Filed 2004·Granted Mar 14, 2006·6 cites·23 claims
- 0547US6936530B1Deposition method for Si-Ge epi layer on different intermediate substratesTAIWAN SEMICONDUCTOR MFG·Filed 2004·Granted Aug 30, 2005·1 cites·31 claims
- 0646US6911369B2Discontinuity prevention for SiGe depositionTAIWAN SEMICONDUCTOR MFG·Filed 2003·Granted Jun 28, 2005·1 cites·16 claims
- 0740US2007240826A1Gas supply device and apparatus for gas etching or cleaning substratesTAIWAN SEMICONDUCTOR MFG·Filed 2006·Application pending·0 cites
- 0833US2003031535A1Wafer positioning check in vertical semiconductor furnacesTAIWAN SEMICONDUCTOR MFG·Filed 2001·Application pending·0 cites
- 0933US2004115878A1Method for manufacturing a silicon germanium based device with crystal defect preventionTAIWAN SEMICONDUCTOR MFG·Filed 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →