Inventor · disambiguated record
Kuniyasu Nakamura
Also filed as: NAKAMURA KUNIYASU
16 granted patents·3 pending applications·466 citations·filing 1978–2021
94Inventor score
Top patents by PatentIndex Score
19 records- 0198US6875984B2Bio electron microscope and observation method of specimenHITACHI LTD·Filed 2003·Granted Apr 5, 2005·105 cites·14 claims
- 0292US7372029B2Scanning transmission electron microscope and scanning transmission electron microscopyHITACHI HIGH TECH CORP·Filed 2007·Granted May 13, 2008·15 cites·8 claims
- 0391US5866905AElectron microscopeHITACHI LTD·Filed 1996·Granted Feb 2, 1999·74 cites·12 claims
- 0490US6822233B2Method and apparatus for scanning transmission electron microscopyHITACHI LTD·Filed 2003·Granted Nov 23, 2004·31 cites·1 claims
- 0590US6531697B1Method and apparatus for scanning transmission electron microscopyHITACHI LTD·Filed 1999·Granted Mar 11, 2003·59 cites·9 claims
- 0690US6051834AElectron microscopeHITACHI LTD·Filed 1998·Granted Apr 18, 2000·65 cites·2 claims
- 0789US8878130B2Scanning electron microscope and scanning transmission electron microscopeINADA HIROMI·Filed 2012·Granted Nov 4, 2014·12 cites·12 claims
- 0889US6750451B2Observation apparatus and observation method using an electron beamHITACHI LTD·Filed 2002·Granted Jun 15, 2004·32 cites·5 claims
- 0989US6548811B1Transmission electron microscope apparatus with equipment for inspecting defects in specimen and method of inspecting defects in specimen using transmission electron microscopeHITACHI LTD·Filed 2000·Granted Apr 15, 2003·34 cites·7 claims
- 1087US7285776B2Scanning transmission electron microscope and electron energy loss spectroscopyHITACHI HIGH TECH CORP·Filed 2005·Granted Oct 23, 2007·10 cites·16 claims
- 1186USD571385SElectron microscopeHITACHI HIGH TECH CORP·Filed 2006·Granted Jun 17, 2008·11 cites·1 claims
- 1284US7227144B2Scanning transmission electron microscope and scanning transmission electron microscopyHITACHI HIGH TECH CORP·Filed 2006·Granted Jun 5, 2007·7 cites·10 claims
- 1369US9293293B2Electron gun and charged particle beam device having an aperture with flare-suppressing coatingWATANABE SHUN-ICHI·Filed 2012·Granted Mar 22, 2016·3 cites·11 claims
- 1452US2025087447A1Charged Particle Beam Apparatus and Sample Analysis MethodHITACHI HIGH TECH CORP·Filed 2021·Application pending·0 cites
- 1548US2007158567A1Apparatus and adjusting method for a scanning transmission electron microscopeNAKAMURA TAISUKE·Filed 2006·Application pending·0 cites
- 1648US2007158568A1Apparatus and measuring method of aberration coefficient of scanning transmission electron microscopeNAKAMURA TAISUKE·Filed 2006·Application pending·0 cites
- 1743US11756764B2Charged particle beam apparatus and method of controlling charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2019·Granted Sep 12, 2023·0 cites·14 claims
- 1841US8710438B2Scanning transmission electron microscope and axial adjustment method thereofNAKAMURA KUNIYASU·Filed 2011·Granted Apr 29, 2014·0 cites·6 claims
- 1935US4160074APolyisocyanate foam having isotropic cells and method and apparatus for preparing sameNIHON SOFLAN CHEM & ENG·Filed 1978·Granted Jul 3, 1979·8 cites·13 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →