Inventor · disambiguated record
Kunihiro Takeda
Also filed as: TAKEDA KUNIHIRO
4 granted patents·2 pending applications·59 citations·filing 1994–2015
73Inventor score
Top patents by PatentIndex Score
6 records- 0179US5473259ASemiconductor device tester capable of simultaneously testing a plurality of integrated circuits at the same temperatureNEC CORP·Filed 1994·Granted Dec 5, 1995·52 cites·5 claims
- 0274US10380117B2Event occurrence place estimation method, computer-readable recording medium storing event occurrence place estimation program, and event occurrence place estimation apparatusFUJITSU LTD·Filed 2015·Granted Aug 13, 2019·3 cites·10 claims
- 0350US2002178129A1Lease-business support apparatus, lease-business support method, recording medium containing program for operating the lease-business support apparatus, and recording medium containing program for executing the lease-business support methodFiled 2002·Application pending·0 cites
- 0448US8405209B2Semiconductor device with varying bump density regions and method of manufacturing the sameTAKEDA KUNIHIRO·Filed 2009·Granted Mar 26, 2013·1 cites·14 claims
- 0545US2013119537A1Semiconductor device and method of manufacturing the sameRENESAS ELECTRONICS CORP·Filed 2013·Application pending·0 cites
- 0641US6549868B2Semiconductor device test system and test methodNEC CORP·Filed 2001·Granted Apr 15, 2003·3 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →