Inventor · disambiguated record
Kuk-Han Yoon
Also filed as: YOON KUK-HAN
8 granted patents·4 pending applications·30 citations·filing 2001–2018
82Inventor score
Top patents by PatentIndex Score
12 records- 0182US8704283B2Semiconductor devicesKIM JONG-KYU·Filed 2010·Granted Apr 22, 2014·8 cites·16 claims
- 0279US9349724B2Semiconductor device having capacitorsSAMSUNG ELECTRONICS CO LTD·Filed 2012·Granted May 24, 2016·6 cites·19 claims
- 0364US7018930B2Method for fabricating semiconductor deviceHYNIX SEMICONDUCTOR INC·Filed 2002·Granted Mar 28, 2006·10 cites·37 claims
- 0463US10854614B2Semiconductor device and method of manufacturing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2018·Granted Dec 1, 2020·1 cites·20 claims
- 0560US7557026B2Contact structure and method of forming the sameSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Jul 7, 2009·2 cites·8 claims
- 0657US7531446B2Method of manufacturing a semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted May 12, 2009·1 cites·21 claims
- 0747US6709986B2Method for manufacturing semiconductor memory device by using photoresist pattern exposed with ArF laser beamHYNIX SEMICONDUCTOR INC·Filed 2002·Granted Mar 23, 2004·2 cites·18 claims
- 0847US2009117723A1Methods of forming a conductive pattern in semiconductor devices and methods of manufacturing semiconductor devices having a conductive patternSAMSUNG ELECTRONICS CO LTD·Filed 2008·Application pending·0 cites
- 0942US2009014833A1Semiconductor device and method of fabricating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2008·Application pending·0 cites
- 1039US2007007656A1Semiconductor device and methods thereofSAMSUNG ELECTRONICS CO LTD·Filed 2006·Application pending·0 cites
- 1137US2006046382A1Method of forming a capacitor for a semiconductor deviceYOON KUK-HAN·Filed 2005·Application pending·0 cites
- 1234US7030006B2Method for forming contact hole and spacer of semiconductor deviceHYNIX SEMICONDUCTOR INC·Filed 2001·Granted Apr 18, 2006·0 cites·9 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →