Inventor · disambiguated record
Kwang Sik Jeong
Also filed as: JEONG KWANG SIK
4 granted patents·3 pending applications·2 citations·filing 2019–2023
58Inventor score
Technology areasH10P
Files withSAMSUNG DISPLAY CO LTD3UNIV INDUSTRY FOUNDATION UIF YONSEI UNIV2DONGGUK UINIVERISTY IND ACADEMIC COOPERATION FOUNDATION1SAMSUNG ELECTRONICS CO LTD1
Top patents by PatentIndex Score
7 records- 0193US11837468B2Stacked structure including semiconductor structure and method of manufacturing the sameSAMSUNG DISPLAY CO LTD·Filed 2021·Granted Dec 5, 2023·2 cites·14 claims
- 0277US12224174B2Stacked structure including semiconductor structure and method of manufacturing the sameSAMSUNG DISPLAY CO LTD·Filed 2023·Granted Feb 11, 2025·0 cites·5 claims
- 0357US12449380B2Defect analysis device and defect analysis method using the sameSAMSUNG DISPLAY CO LTD·Filed 2023·Granted Oct 21, 2025·0 cites·20 claims
- 0452US2025116612A1Method and apparatus for monitoring defect of semiconductor structureUNIV INDUSTRY FOUNDATION UIF YONSEI UNIV·Filed 2023·Application pending·0 cites
- 0552US2025155379A1Process monitoring method and deviceUNIV INDUSTRY FOUNDATION UIF YONSEI UNIV·Filed 2023·Application pending·0 cites
- 0651US2025116613A1Thin film monitoring method and deviceDONGGUK UINIVERISTY IND ACADEMIC COOPERATION FOUNDATION·Filed 2023·Application pending·0 cites
- 0742US10776549B2Method of manufacturing a semiconductor device using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted Sep 15, 2020·0 cites·17 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →