Inventor · disambiguated record
Kwang Rak Kim
Also filed as: KIM KWANG RAK
1 granted patent·1 pending application·0 citations·filing 2019–2022
3Inventor score
Files withSAMSUNG ELECTRONICS CO LTD2
Top patents by PatentIndex Score
2 records- 0146US12105027B2Apparatus for inspecting substrate and method for fabricating semiconductor device using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Oct 1, 2024·0 cites·18 claims
- 0238US2020182777A1Substrate inspection apparatus, method of calibrating the substrate inspection apparatus, and method of fabricating semiconductor device using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2019·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →