Inventor · disambiguated record
Kwang-Sook Noh
Also filed as: NOH KWANG SOOK
13 granted patents·120 citations·filing 2002–2022
91Inventor score
Top patents by PatentIndex Score
13 records- 0195US8218137B2Methods of operating DRAM devices having adjustable internal refresh cycles that vary in response to on-chip temperature changesNOH KWANG-SOOK·Filed 2010·Granted Jul 10, 2012·27 cites·3 claims
- 0292US9147461B1Semiconductor memory device performing a refresh operation, and memory system including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2014·Granted Sep 29, 2015·14 cites·13 claims
- 0382US8331161B2Semiconductor memory device having swap function for data output padsNOH KWANG-SOOK·Filed 2010·Granted Dec 11, 2012·10 cites·12 claims
- 0477US8675438B2Methods of operating DRAM devices having adjustable internal refresh cycles that vary in response to on-chip temperature changesNOH KWANG SOOK·Filed 2013·Granted Mar 18, 2014·4 cites·10 claims
- 0576US7843752B2Circuit and method for controlling refresh periods in semiconductor memory devicesSAMSUNG ELECTRONICS CO LTD·Filed 2008·Granted Nov 30, 2010·7 cites·8 claims
- 0675US7230475B2Semiconductor devices including an external power voltage control function and methods of operating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Jun 12, 2007·25 cites·12 claims
- 0772US8537633B2Methods of operating DRAM devices having adjustable internal refresh cycles that vary in response to on-chip temperature changesNOH KWANG-SOOK·Filed 2012·Granted Sep 17, 2013·3 cites·9 claims
- 0872US6590429B2Data receivers for reproducing data input signals and methods for detecting data signals in data input receiversSAMSUNG ELECTRONICS CO LTD·Filed 2002·Granted Jul 8, 2003·16 cites·17 claims
- 0964US7716550B2Semiconductor IC including pad for wafer test and method of testing wafer including semiconductor ICSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted May 11, 2010·3 cites·20 claims
- 1056US7541845B2Signal receiver apparatus and method for detecting logic state represented by an input signal and semiconductor integrated circuit device having the sameSAMSUNG ELECTRONICS CO LTD·Filed 2002·Granted Jun 2, 2009·5 cites·18 claims
- 1154US12176021B2Volatile memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Dec 24, 2024·0 cites·19 claims
- 1254US12014769B2Volatile memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Jun 18, 2024·0 cites·20 claims
- 1351US6876564B2Integrated circuit device and method for applying different types of signals to internal circuit via one pinSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted Apr 5, 2005·6 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →