Inventor · disambiguated record
Kwang-Won Park
Also filed as: PARK KWANG-WON
10 granted patents·48 citations·filing 2004–2022
86Inventor score
Top patents by PatentIndex Score
10 records- 0178US11699469B2Operating method of host device and memory device and memory systemSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Jul 11, 2023·1 cites·21 claims
- 0273US8504760B2Method and apparatus for managing erase count of memory deviceLEE HAK-YONG·Filed 2010·Granted Aug 6, 2013·6 cites·19 claims
- 0373US8178928B2Intermediate structures having reduced width contact holes that are formed during manufacture of memory cells having contact structuresSHIN HYUN-CHUL·Filed 2010·Granted May 15, 2012·5 cites·7 claims
- 0473US7333367B2Flash memory devices including multiple dummy cell array regionsSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Feb 19, 2008·8 cites·19 claims
- 0570US7158419B2Methods of fabricating flash memory devices including multiple dummy cell array regionsSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Jan 2, 2007·16 cites·16 claims
- 0664US11780451B2Method for operating host device and memory device and vehicle comprising the host device and memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Oct 10, 2023·0 cites·20 claims
- 0763US7732317B2Methods of forming contact structures for memory cells using both anisotropic and isotropic etchingSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Jun 8, 2010·11 cites·26 claims
- 0858US8618540B2Semiconductor packagesJO JUN-HO·Filed 2011·Granted Dec 31, 2013·1 cites·23 claims
- 0954US12067292B2Method of identifying information related to an eye open monitor (EOM) operation performed in a memory device, and memory system performing the methodSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Aug 20, 2024·0 cites·20 claims
- 1043US9096797B2Silicate phosphor, method of manufacturing silicate phosphor, and light-generating device having silicate phosphorSHIN MYEONG-JU·Filed 2012·Granted Aug 4, 2015·0 cites·19 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →