Inventor · disambiguated record

Kwang-Joon Park

Also filed as: PARK KWANG-JOON

0 granted patents·2 pending applications·0 citations·filing 2004–2006

Technology areasG11C

Files withKIM WOO JIN1 SAMSUNG ELECTRONICS CO LTD1

Top patents by PatentIndex Score

2 records

0134US2007127300A1Bun-in test method semiconductor memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 2006·Application pending·0 cites
0229US2005276131A1Semiconductor memory device and burn-in test method thereforKIM WOO-JIN·Filed 2004·Application pending·0 cites

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →