Inventor · disambiguated record
Kwang-Hyun Yang
Also filed as: YANG KWANG J · YANG KWANG-HYUN
2 granted patents·1 pending application·2 citations·filing 2005–2021
33Inventor score
Top patents by PatentIndex Score
3 records- 0171US10541182B2Method of inspecting semiconductor substrate and method of manufacturing semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2018·Granted Jan 21, 2020·2 cites·17 claims
- 0243US12283497B2Semiconductor deposition monitoring deviceSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Apr 22, 2025·0 cites·7 claims
- 0334US2006239316A1Apparatus for controlling temperature of optical module using uncooled laser diodeOPTO ELECTRONICS SOLUTIONS CO·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →